Infrared spectroscopy with an atomic force microscope

Applied Spectroscopy

Volumn 54, Issue 3, 2000, Pages 349-352

  Anderson, Mark S ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; PHOTODETECTORS;

PHOTOTHERMAL DISPLACEMENT;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

EID: 0033885868     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702001949618     Document Type: Article

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