-
1
-
-
0003552056
-
-
Semiconductor Industry Association SIA, San Jose, CA
-
Semiconductor Industry Association (SIA), The National Technology Roadmap for Semiconductors, San Jose, CA, 1994, p. 63.
-
(1994)
The National Technology Roadmap for Semiconductors
, pp. 63
-
-
-
2
-
-
0042028861
-
Micro springs for temporary chip connection
-
Aug
-
C. Krüger, D. J. Bartelink, T. Fritz, T. Leuerer, W. Mokwa, and U. Schnakenberg, "Micro springs for temporary chip connection," Sens. Actuators A, Phys., vol. 85, no. 1-3, pp. 371-376, Aug. 2000.
-
(2000)
Sens. Actuators A, Phys
, vol.85
, Issue.1-3
, pp. 371-376
-
-
Krüger, C.1
Bartelink, D.J.2
Fritz, T.3
Leuerer, T.4
Mokwa, W.5
Schnakenberg, U.6
-
3
-
-
0036803865
-
Galvanisch abgeschiedene NiW-Legierungsschichten für die Mikrosystemtechnik, Teil 2: Abscheidungen auf der Basis eines Sulfamatelektrolyten
-
T. Fritz, W. Mokwa, and U. Schnakenberg, "Galvanisch abgeschiedene NiW-Legierungsschichten für die Mikrosystemtechnik, Teil 2: Abscheidungen auf der Basis eines Sulfamatelektrolyten," Galvanotechnik, vol. 92, no. 10, pp. 2684-2690, 2002.
-
(2002)
Galvanotechnik
, vol.92
, Issue.10
, pp. 2684-2690
-
-
Fritz, T.1
Mokwa, W.2
Schnakenberg, U.3
-
4
-
-
84944739341
-
Micro-spring force characterization and applications in integrated circuit packaging and scanning probe MEMS metrology
-
Boston, MA, Jun. 8-12
-
E. M. Chow et al., "Micro-spring force characterization and applications in integrated circuit packaging and scanning probe MEMS metrology," in Proc. Transducers, 12th Int. Conf. Solid State Sens., Actuators Microsyst., Boston, MA, Jun. 8-12, 2003, pp. 408-411.
-
(2003)
Proc. Transducers, 12th Int. Conf. Solid State Sens., Actuators Microsyst
, pp. 408-411
-
-
Chow, E.M.1
-
5
-
-
24644483220
-
Solder free pressure contact micro-springs in high-density flip-chip packages
-
E. M. Chow et al., "Solder free pressure contact micro-springs in high-density flip-chip packages," in Proc. Electron. Compon. Technol. Conf., 2005, pp. 1119-1126.
-
(2005)
Proc. Electron. Compon. Technol. Conf
, pp. 1119-1126
-
-
Chow, E.M.1
-
6
-
-
33846418456
-
Pressure contact micro-springs in small pitch flip-chip packages
-
Dec
-
E. M. Chow et al., "Pressure contact micro-springs in small pitch flip-chip packages," IEEE Trans. Compon. Packag. Technol., vol. 29, no. 4, pp. 796-803, Dec. 2006.
-
(2006)
IEEE Trans. Compon. Packag. Technol
, vol.29
, Issue.4
, pp. 796-803
-
-
Chow, E.M.1
-
7
-
-
0347014039
-
Study of mechanical behaviour of compliant micro-springs for next generation probing applications
-
Dec
-
M. Ahmad and S. K. Sitaraman, "Study of mechanical behaviour of compliant micro-springs for next generation probing applications," J. Electron. Packag., vol. 124, no. 4, pp. 411-418, Dec. 2002.
-
(2002)
J. Electron. Packag
, vol.124
, Issue.4
, pp. 411-418
-
-
Ahmad, M.1
Sitaraman, S.K.2
-
8
-
-
0036544470
-
Characteristics of low force contact process for MEMS probe cards
-
Apr
-
T. Itch, K. Kataoka, and T. Suga, "Characteristics of low force contact process for MEMS probe cards," Sens. Actuators A, Phys., vol. 97/98, pp. 462-467, Apr. 2002.
-
(2002)
Sens. Actuators A, Phys
, vol.97-98
, pp. 462-467
-
-
Itch, T.1
Kataoka, K.2
Suga, T.3
-
9
-
-
0037438892
-
Electroplating Ni micro-cantilevers for low contact-force IC-probing
-
Jan
-
K. Kataoka et al., "Electroplating Ni micro-cantilevers for low contact-force IC-probing," Sens. Actuators A, Phys., vol. 103, no. 1/2, pp. 116-121, Jan. 2003.
-
(2003)
Sens. Actuators A, Phys
, vol.103
, Issue.1-2
, pp. 116-121
-
-
Kataoka, K.1
-
10
-
-
4243103788
-
A fine pitch MEMS probe unit for flat panel display as manufacturing MEMS applications
-
Sep
-
B.-H. Kim et al., "A fine pitch MEMS probe unit for flat panel display as manufacturing MEMS applications," Sens. Actuators A, Phys., vol. 115, no. 1, pp. 46-52, Sep. 2004.
-
(2004)
Sens. Actuators A, Phys
, vol.115
, Issue.1
, pp. 46-52
-
-
Kim, B.-H.1
-
11
-
-
0042028861
-
Micro-springs for temporary chip connections
-
Aug
-
C. Kruger et al., "Micro-springs for temporary chip connections," Sens. Actuators, vol. 85, no. 1-3, pp. 371-376, Aug. 2000.
-
(2000)
Sens. Actuators
, vol.85
, Issue.1-3
, pp. 371-376
-
-
Kruger, C.1
-
13
-
-
24144460561
-
MEMS spring probe for non-destructive wafer level chip test
-
K. Lee and B. Kim, "MEMS spring probe for non-destructive wafer level chip test," J. Micromech. Microeng., vol. 15, pp. 953-957, 2005.
-
(2005)
J. Micromech. Microeng
, vol.15
, pp. 953-957
-
-
Lee, K.1
Kim, B.2
-
14
-
-
36949038059
-
Design optimization for electroplated micro-springs
-
T. Leuerer et al., "Design optimization for electroplated micro-springs," in Tech. Dig. Micro Mater Micro Mater., 2000, pp. 767-770.
-
(2000)
Tech. Dig. Micro Mater Micro Mater
, pp. 767-770
-
-
Leuerer, T.1
-
15
-
-
1942468582
-
Measurement system for low force and small displacement contacts
-
Apr
-
B. L. Pruitt, W.-T. Park, and T.W. Kenny, "Measurement system for low force and small displacement contacts," J. Microelectromech. Syst. vol. 13, no. 2, pp. 220-229, Apr. 2004.
-
(2004)
J. Microelectromech. Syst
, vol.13
, Issue.2
, pp. 220-229
-
-
Pruitt, B.L.1
Park, W.-T.2
Kenny, T.W.3
-
16
-
-
3042783194
-
NiW-micro springs for chip connection
-
Maastricht, The Netherlands, Jan. 25-29
-
C. Krüger, I. T. Lee, W. Mokwa, and U. Schnakenberg, "NiW-micro springs for chip connection," in Proc. 17th IEEE Int. Conf. MEMS, Maastricht, The Netherlands, Jan. 25-29, 2004, pp. 117-120.
-
(2004)
Proc. 17th IEEE Int. Conf. MEMS
, pp. 117-120
-
-
Krüger, C.1
Lee, I.T.2
Mokwa, W.3
Schnakenberg, U.4
-
17
-
-
0002547182
-
Electrical characteristics of micro mechanical contacts
-
New York: Springer-Verlag
-
S. Hannoe and H. Hosaka, "Electrical characteristics of micro mechanical contacts," in Microsystem Technologies 3. New York: Springer-Verlag, 1996, pp. 31-35.
-
(1996)
Microsystem Technologies 3
, pp. 31-35
-
-
Hannoe, S.1
Hosaka, H.2
-
18
-
-
0004987902
-
Grundlagen und modelle zur entwicklung und optimierung von silizium-mikrorelais,
-
Ph.D. dissertation, Tech. Univ. Berlin, Berlin, Germany
-
J. Schimkat, "Grundlagen und modelle zur entwicklung und optimierung von silizium-mikrorelais," Ph.D. dissertation, Tech. Univ. Berlin, Berlin, Germany, 1996.
-
(1996)
-
-
Schimkat, J.1
-
19
-
-
36949029461
-
Development of temporary contact elements for micro electro mechanical systems,
-
Ph.D. dissertation, Aachen Univ, Aachen, Germany
-
C. Krüger, "Development of temporary contact elements for micro electro mechanical systems," Ph.D. dissertation, Aachen Univ., Aachen., Germany, 2003.
-
(2003)
-
-
Krüger, C.1
-
20
-
-
0042970380
-
Determination of Young's modulus of electroplated nickel
-
Sep
-
T. Fritz, M. Griepentrog, W. Mokwa, and U. Schnakenberg, "Determination of Young's modulus of electroplated nickel," Electrochim. Acta, vol. 48, no. 20, pp. 3029-3035, Sep. 2003.
-
(2003)
Electrochim. Acta
, vol.48
, Issue.20
, pp. 3029-3035
-
-
Fritz, T.1
Griepentrog, M.2
Mokwa, W.3
Schnakenberg, U.4
-
21
-
-
0029707015
-
Millimeter-wave performance of chip interconnections using wire bonding and flip-chip
-
T. Krems, W. Haydl, H. Massler, and J. Rüdiger, "Millimeter-wave performance of chip interconnections using wire bonding and flip-chip," in IEEE MTT-S Tech. Dig., 1996, pp. 247-250.
-
(1996)
IEEE MTT-S Tech. Dig
, pp. 247-250
-
-
Krems, T.1
Haydl, W.2
Massler, H.3
Rüdiger, J.4
-
22
-
-
0024069463
-
Mechanical deflection of cantilever microbeams: A new technique for testing the mechanical properties of thin films
-
T. Weihs, S. Hong, J. Bravman, and W. Nix, "Mechanical deflection of cantilever microbeams: A new technique for testing the mechanical properties of thin films," J. Mater. Res., vol. 3, no. 5, pp. 931-942, 1988.
-
(1988)
J. Mater. Res
, vol.3
, Issue.5
, pp. 931-942
-
-
Weihs, T.1
Hong, S.2
Bravman, J.3
Nix, W.4
|