-
1
-
-
0034479825
-
An overview of MCM/KGD development activities in Japan
-
Las Vegas, NV, USA
-
Sudo, T., "An overview of MCM/KGD development activities in Japan," 50th Electronic Components and Technology Conference, Las Vegas, NV, USA, 2000, pp. 805-809.
-
(2000)
50th Electronic Components and Technology Conference
, pp. 805-809
-
-
Sudo, T.1
-
2
-
-
4544359901
-
SOP: What is it and why? A new microsystem-integration technology paradigm-Moore's law for system integration of miniaturized convergent systems of the next decade
-
Tummala, R. R., "SOP: what is it and why? A new microsystem- integration technology paradigm-Moore's law for system integration of miniaturized convergent systems of the next decade," IEEE Transactions on Advanced Packaging, vol. 27, (2004), pp. 241-249.
-
(2004)
IEEE Transactions on Advanced Packaging
, vol.27
, pp. 241-249
-
-
Tummala, R.R.1
-
3
-
-
24644449371
-
Wafer level packaing using stressedmetal technology
-
Long Beach, CA, pp. tbd.
-
Fork, D. K., Chua, C. L., Van Schuylenbergh, K., Chow, E. M., Hantschel, T., Kosgalwies, S., Wong, L., and Geluz, V., "Wafer Level Packaing Using StressedMetal Technology," 37th International Symposium On Microelectronics (IMAPS), Long Beach, CA, 2004, pp. tbd.
-
(2004)
37th International Symposium on Microelectronics (IMAPS)
-
-
Fork, D.K.1
Chua, C.L.2
Van Schuylenbergh, K.3
Chow, E.M.4
Hantschel, T.5
Kosgalwies, S.6
Wong, L.7
Geluz, V.8
-
4
-
-
0742303966
-
Out-of-plane high-Q inductors on low-resistance silicon
-
Chua, C. L., Fork, D. K., Van Schuylenbergh, K., and Lu, J.-P., "Out-of-plane high-Q inductors on low-resistance silicon," Journal of Microelectromechanical Systems, vol. 12, (2003), pp. 989-995.
-
(2003)
Journal of Microelectromechanical Systems
, vol.12
, pp. 989-995
-
-
Chua, C.L.1
Fork, D.K.2
Van Schuylenbergh, K.3
Lu, J.-P.4
-
5
-
-
0036297031
-
Sea of leads ultra high-density compliant wafer-level packaging technology
-
San Diego, CA
-
Bakir, M. S., Reed, H. A., Kohl, P. A., Martin, K. P., and Meindl, J. D., "Sea Of Leads Ultra High-Density Compliant Wafer-Level Packaging Technology," 52nd Electronic Components and Technology Conference, San Diego, CA, 2002, pp. 1087-1094.
-
(2002)
52nd Electronic Components and Technology Conference
, pp. 1087-1094
-
-
Bakir, M.S.1
Reed, H.A.2
Kohl, P.A.3
Martin, K.P.4
Meindl, J.D.5
-
6
-
-
2342453304
-
Bump wafer level packaging, A new packaging platform (not only) for memory products
-
Boston, MA
-
Hedler, H., Meyer, T., Leiberg, W., and Irsigler, R., "Bump Wafer Level Packaging, A New Packaging Platform (not only) For Memory Products," 36th International Symposium on Microelectronics, Boston, MA, 2003, pp. 681-686.
-
(2003)
36th International Symposium on Microelectronics
, pp. 681-686
-
-
Hedler, H.1
Meyer, T.2
Leiberg, W.3
Irsigler, R.4
-
7
-
-
24644493481
-
Microspring contacts on silicon: Delivering Moore's law-type scaling to semiconductor package, test and assembly
-
Denver, CO, USA
-
Novitsky, J. and Miller, C., "MicroSpring contacts on silicon: delivering Moore's law-type scaling to semiconductor package, test and assembly," 2000 HD International Conference on High-Density Interconnect and Systems Packaging, Denver, CO, USA, 2000, pp. 250-255.
-
(2000)
2000 HD International Conference on High-density Interconnect and Systems Packaging
, pp. 250-255
-
-
Novitsky, J.1
Miller, C.2
-
8
-
-
0031633080
-
Flip-chip bonding on A 6- Um pitch using thin film microspring technology
-
Seattle, Washington
-
Smith, D. L., Fork, D. K., Thornton, R. L., Alimonda, A., Chua, C. L., Dunnrowicz, C., and Ho, J., "Flip-Chip Bonding On A 6- um Pitch Using Thin Film Microspring Technology," 48th Electronic Components and Technology Conference, Seattle, Washington, 1998, pp. 325-329.
-
(1998)
48th Electronic Components and Technology Conference
, pp. 325-329
-
-
Smith, D.L.1
Fork, D.K.2
Thornton, R.L.3
Alimonda, A.4
Chua, C.L.5
Dunnrowicz, C.6
Ho, J.7
-
9
-
-
0036610810
-
Densely packed optoelectronic interconnect using micromachined springs
-
Chua, C. L., Fork, D. K., and Hantschel, T., "Densely packed optoelectronic interconnect using micromachined springs," IEEE Photonics Technology Letters, vol. 14, (2002), pp. 846-848.
-
(2002)
IEEE Photonics Technology Letters
, vol.14
, pp. 846-848
-
-
Chua, C.L.1
Fork, D.K.2
Hantschel, T.3
-
10
-
-
24644433525
-
-
www.nanonexus.com.
-
-
-
-
11
-
-
0036122669
-
Low contact-force and compliant MEMS probe card utilizing fritting contact
-
Kataoka, K., Kawamura, S., Itoh, T., Suga, T., Ishikawa, K., and Honma, H., "Low contact-force and compliant MEMS probe card utilizing fritting contact," Technical Digest. MEMS 2002 IEEE International Conference. Fifteenth IEEE International Conference on Micro Electro Mechanical Systems, 2002, pp. 364-367.
-
(2002)
Technical Digest. MEMS 2002 IEEE International Conference. Fifteenth IEEE International Conference on Micro Electro Mechanical Systems
, pp. 364-367
-
-
Kataoka, K.1
Kawamura, S.2
Itoh, T.3
Suga, T.4
Ishikawa, K.5
Honma, H.6
-
12
-
-
16244377507
-
Development of an electrostatically actuated MEMS switching probe card
-
Itoh, T., Kawamura, S., Suga, T., and Kataoka, K., "Development of an electrostatically actuated MEMS switching probe card," Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts, 2004, pp. 226-230.
-
(2004)
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
, pp. 226-230
-
-
Itoh, T.1
Kawamura, S.2
Suga, T.3
Kataoka, K.4
-
13
-
-
0031361528
-
An examination of the metallic bonding of a clad material and two gold plating systems under constant force fretting conditions
-
Aukland, N., Hardee, H., Wehr, A., Brennan, S., and Lees, P., "An examination of the metallic bonding of a clad material and two gold plating systems under constant force fretting conditions," Electrical Contacts - 1997 Proceedings of the Forty-Third IEEE Holm Conference on Electrical Contacts, 1997, pp. 7-19.
-
(1997)
Electrical Contacts - 1997 Proceedings of the Forty-third IEEE Holm Conference on Electrical Contacts
, pp. 7-19
-
-
Aukland, N.1
Hardee, H.2
Wehr, A.3
Brennan, S.4
Lees, P.5
-
14
-
-
0019373448
-
Fretting corrosion of gold-plated connector contacts
-
Antler, M. and Drozdowicz, M. H., "Fretting corrosion of gold-plated connector contacts," Wear, vol. 74, (1981), pp. 27-50.
-
(1981)
Wear
, vol.74
, pp. 27-50
-
-
Antler, M.1
Drozdowicz, M.H.2
-
15
-
-
0026118977
-
Fretting failure of electroplated gold contacts
-
Tian, H., Saka, N., and Rabinowicz, E., "Fretting failure of electroplated gold contacts," Wear, vol. 142, (1991), pp. 265-29.
-
(1991)
Wear
, vol.142
, pp. 265-329
-
-
Tian, H.1
Saka, N.2
Rabinowicz, E.3
-
16
-
-
0028444632
-
Reliability of area array pressure contacts on the DTAB package
-
Karnezos, M., Pendse, R. D., Afshari, B., Matta, F., and Scholz, K. D., "Reliability of area array pressure contacts on the DTAB package," IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part A, vol. 17, (1994), pp. 263-269.
-
(1994)
IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part A
, vol.17
, pp. 263-269
-
-
Karnezos, M.1
Pendse, R.D.2
Afshari, B.3
Matta, F.4
Scholz, K.D.5
-
17
-
-
0036287260
-
Alternative Z-axis connector technologies for high-density 3-D packaging
-
Spiesshoefer, S., Schaper, L., Maner, K., Porter, E., Barlow, F., Glover, M., Marsh, W., Bates, G., and Lucas, M., "Alternative Z-axis connector technologies for high-density 3-D packaging," Proceedings of 52nd Electronic Components and Technology Conference, 2002, pp. 1106-1109.
-
(2002)
Proceedings of 52nd Electronic Components and Technology Conference
, pp. 1106-1109
-
-
Spiesshoefer, S.1
Schaper, L.2
Maner, K.3
Porter, E.4
Barlow, F.5
Glover, M.6
Marsh, W.7
Bates, G.8
Lucas, M.9
-
18
-
-
1942468582
-
Measurement system for low force and small displacement contacts
-
Pruitt, B. L., Park, W.-T., and Kenny, T. W., "Measurement system for low force and small displacement contacts," Journal of Microelectromechanical Systems, vol. 13, (2004), pp. 220-229.
-
(2004)
Journal of Microelectromechanical Systems
, vol.13
, pp. 220-229
-
-
Pruitt, B.L.1
Park, W.-T.2
Kenny, T.W.3
-
20
-
-
0037674307
-
Intermittency study of a stressed-metal micro-spring sliding electrical contact
-
New Orleans, LA, USA
-
Chow, E. M., Klein, K., Fork, D. K., Hantschel, T., Chua, C. L., Wong, L., and Van Schuylenbergh, K., "Intermittency study of a stressed-metal micro-spring sliding electrical contact," 53rd Electronic Components and Technology Conference, New Orleans, LA, USA, 2003, pp. 1714-1717.
-
(2003)
53rd Electronic Components and Technology Conference
, pp. 1714-1717
-
-
Chow, E.M.1
Klein, K.2
Fork, D.K.3
Hantschel, T.4
Chua, C.L.5
Wong, L.6
Van Schuylenbergh, K.7
-
21
-
-
0038696516
-
Fabrication of highly conductive stressed-metal springs and their use as sliding-contact interconnects
-
Hantschel, T., Wong, L., Chua, C. L., and Fork, D. K., "Fabrication of highly conductive stressed-metal springs and their use as sliding-contact interconnects," Microelectronic Engineering, vol. 67-68, (2003), pp. 690-695.
-
(2003)
Microelectronic Engineering
, vol.67-68
, pp. 690-695
-
-
Hantschel, T.1
Wong, L.2
Chua, C.L.3
Fork, D.K.4
-
22
-
-
0034837202
-
Stress engineered metal interconnects
-
Santa Clara, CA, USA
-
Fork, D. K., Chua, C., Wong, L., Alimonda, A. S., Smith, D. L., Modi, M., Zhu, Q., Ma, L., and Sitaraman, S., "Stress engineered metal interconnects," 2001 HD International Conference on High-Density Interconnect and Systems Packaging, Santa Clara, CA, USA, 2001, pp. 195-200.
-
(2001)
2001 HD International Conference on High-density Interconnect and Systems Packaging
, pp. 195-200
-
-
Fork, D.K.1
Chua, C.2
Wong, L.3
Alimonda, A.S.4
Smith, D.L.5
Modi, M.6
Zhu, Q.7
Ma, L.8
Sitaraman, S.9
-
23
-
-
0037438892
-
Electroplating Ni micro-cantilevers for low contact-force IC probing
-
Kataoka, K., Kawamura, S., Itoh, T., Ishikawa, K., Honma, H., and Suga, T., "Electroplating Ni micro-cantilevers for low contact-force IC probing," Sensors and Actuators A (Physical), vol. A103, (2003), pp. 116-121.
-
(2003)
Sensors and Actuators A (Physical)
, vol.A103
, pp. 116-121
-
-
Kataoka, K.1
Kawamura, S.2
Itoh, T.3
Ishikawa, K.4
Honma, H.5
Suga, T.6
-
24
-
-
84944739341
-
Micro-spring force characterization and applications in integrated circuit packaging and scanning probe MEMS metrology
-
Boston, MA, USA
-
Chow, E. M., Hantschel, T., Klein, K., Fork, D. K., Chua, C. L., Wong, L., and Van Schuylenbergh, K., "Micro-spring force characterization and applications in integrated circuit packaging and scanning probe MEMS metrology," IEEE International Solid-State Sensors and Actuators Conference, Boston, MA, USA, 2003, pp. 408-411 vol.1.
-
(2003)
IEEE International Solid-state Sensors and Actuators Conference
, vol.1
, pp. 408-411
-
-
Chow, E.M.1
Hantschel, T.2
Klein, K.3
Fork, D.K.4
Chua, C.L.5
Wong, L.6
Van Schuylenbergh, K.7
-
25
-
-
0034482897
-
Flexible micro-spring interconnects for high performance probing
-
Las Vegas, NV, USA
-
Haemer, J. M., Sitaraman, S. K., Fork, D. K., Chong, F. C., Mok, S., Smith, D. L., and Swiatowiec, F., "Flexible micro-spring interconnects for high performance probing," 2000 Proceedings. 50th Electronic Components and Technology Conference, Las Vegas, NV, USA, 2000, pp. 1157-1163.
-
(2000)
2000 Proceedings. 50th Electronic Components and Technology Conference
, pp. 1157-1163
-
-
Haemer, J.M.1
Sitaraman, S.K.2
Fork, D.K.3
Chong, F.C.4
Mok, S.5
Smith, D.L.6
Swiatowiec, F.7
-
26
-
-
0034791335
-
Performance of microcontacts tested with a novel MEMS device
-
Bromley, S. C. and Nelson, B. J., "Performance of microcontacts tested with a novel MEMS device," Electrical Contacts, 2001. Proceedings of the Forty-Seventh IEEE Holm Conference on Electrical Contacts, 2001, pp. 122-127.
-
(2001)
Electrical Contacts, 2001. Proceedings of the Forty-seventh IEEE Holm Conference on Electrical Contacts
, pp. 122-127
-
-
Bromley, S.C.1
Nelson, B.J.2
|