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Volumn 2, Issue , 2005, Pages 1119-1126

Solder-free pressure contact micro-springs in high-density flip-chip packages

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; ELECTRIC RESISTANCE; FLIP CHIP DEVICES; PRESSURE EFFECTS; SOLDERING ALLOYS; THERMAL CYCLING;

EID: 24644483220     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (12)

References (26)
  • 1
    • 0034479825 scopus 로고    scopus 로고
    • An overview of MCM/KGD development activities in Japan
    • Las Vegas, NV, USA
    • Sudo, T., "An overview of MCM/KGD development activities in Japan," 50th Electronic Components and Technology Conference, Las Vegas, NV, USA, 2000, pp. 805-809.
    • (2000) 50th Electronic Components and Technology Conference , pp. 805-809
    • Sudo, T.1
  • 2
    • 4544359901 scopus 로고    scopus 로고
    • SOP: What is it and why? A new microsystem-integration technology paradigm-Moore's law for system integration of miniaturized convergent systems of the next decade
    • Tummala, R. R., "SOP: what is it and why? A new microsystem- integration technology paradigm-Moore's law for system integration of miniaturized convergent systems of the next decade," IEEE Transactions on Advanced Packaging, vol. 27, (2004), pp. 241-249.
    • (2004) IEEE Transactions on Advanced Packaging , vol.27 , pp. 241-249
    • Tummala, R.R.1
  • 7
    • 24644493481 scopus 로고    scopus 로고
    • Microspring contacts on silicon: Delivering Moore's law-type scaling to semiconductor package, test and assembly
    • Denver, CO, USA
    • Novitsky, J. and Miller, C., "MicroSpring contacts on silicon: delivering Moore's law-type scaling to semiconductor package, test and assembly," 2000 HD International Conference on High-Density Interconnect and Systems Packaging, Denver, CO, USA, 2000, pp. 250-255.
    • (2000) 2000 HD International Conference on High-density Interconnect and Systems Packaging , pp. 250-255
    • Novitsky, J.1    Miller, C.2
  • 9
    • 0036610810 scopus 로고    scopus 로고
    • Densely packed optoelectronic interconnect using micromachined springs
    • Chua, C. L., Fork, D. K., and Hantschel, T., "Densely packed optoelectronic interconnect using micromachined springs," IEEE Photonics Technology Letters, vol. 14, (2002), pp. 846-848.
    • (2002) IEEE Photonics Technology Letters , vol.14 , pp. 846-848
    • Chua, C.L.1    Fork, D.K.2    Hantschel, T.3
  • 10
    • 24644433525 scopus 로고    scopus 로고
    • www.nanonexus.com.
  • 14
    • 0019373448 scopus 로고
    • Fretting corrosion of gold-plated connector contacts
    • Antler, M. and Drozdowicz, M. H., "Fretting corrosion of gold-plated connector contacts," Wear, vol. 74, (1981), pp. 27-50.
    • (1981) Wear , vol.74 , pp. 27-50
    • Antler, M.1    Drozdowicz, M.H.2
  • 15
    • 0026118977 scopus 로고
    • Fretting failure of electroplated gold contacts
    • Tian, H., Saka, N., and Rabinowicz, E., "Fretting failure of electroplated gold contacts," Wear, vol. 142, (1991), pp. 265-29.
    • (1991) Wear , vol.142 , pp. 265-329
    • Tian, H.1    Saka, N.2    Rabinowicz, E.3
  • 21
    • 0038696516 scopus 로고    scopus 로고
    • Fabrication of highly conductive stressed-metal springs and their use as sliding-contact interconnects
    • Hantschel, T., Wong, L., Chua, C. L., and Fork, D. K., "Fabrication of highly conductive stressed-metal springs and their use as sliding-contact interconnects," Microelectronic Engineering, vol. 67-68, (2003), pp. 690-695.
    • (2003) Microelectronic Engineering , vol.67-68 , pp. 690-695
    • Hantschel, T.1    Wong, L.2    Chua, C.L.3    Fork, D.K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.