Nanomachining of mesoscopic electronic devices using an atomic force microscope

Applied Physics Letters

Volumn 75, Issue 8, 1999, Pages 1107-1109

  Schumacher, H W ^a   Keyser, U F ^a   Zeitler, U ^a   Haug, R J ^a   Eberl, K ^b  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000240088     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124611     Document Type: Article

References (14)

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