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1
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0001784769
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Reliability of Plastic Ball Grid Array Assembly
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J. Lau Editor, McGraw-Hill, Inc, New York
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R. Darveaux, K. Banerji, A. Mawer, and G. Dody, "Reliability of Plastic Ball Grid Array Assembly," Ball Grid Array Technology. J. Lau Editor, McGraw-Hill, Inc., New York, 1995.
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(1995)
Ball Grid Array Technology
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Darveaux, R.1
Banerji, K.2
Mawer, A.3
Dody, G.4
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2
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24644469657
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R. Darveaux, Shear Deformation of Lead Free Solder Joints, Proc. 2005 ECTC, pp. 882-893.
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R. Darveaux, "Shear Deformation of Lead Free Solder Joints," Proc. 2005 ECTC, pp. 882-893.
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3
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70350324728
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Mechanical Testing of Solder Joint Arrays versus Bulk Solder Specimens
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R. Darveaux, "Mechanical Testing of Solder Joint Arrays versus Bulk Solder Specimens," Proc. SMTAI, 2006.
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(2006)
Proc. SMTAI
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Darveaux, R.1
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4
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10444236402
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Accumulated Creep Strain and Energy Density Based Thermal Fatigue Life Prediction Models for SnAgCu Solder Joints
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A. Syed, "Accumulated Creep Strain and Energy Density Based Thermal Fatigue Life Prediction Models for SnAgCu Solder Joints," Proceedings ECTC 2004, s16p7, pp. 737-746.
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Proceedings ECTC 2004, s16p7
, pp. 737-746
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Syed, A.1
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5
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0038109900
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J. Lau, W. Dauksher, and P. Vianco, Acceleration Models, Constitutive Equations, and Reliability of Lead-Free Solders and Joints, Proceedings 2003 ECTC, s05p7C, pp. 229-236.
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J. Lau, W. Dauksher, and P. Vianco, "Acceleration Models, Constitutive Equations, and Reliability of Lead-Free Solders and Joints," Proceedings 2003 ECTC, s05p7C, pp. 229-236.
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6
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0038351738
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J.W. Morris, Jr., H.G. Song, and F. Hua, Creep Properties of Sn-rich Solder Joints, Proceedings 2003 ECTC, s02p3C, pp. 54-57.
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J.W. Morris, Jr., H.G. Song, and F. Hua, "Creep Properties of Sn-rich Solder Joints," Proceedings 2003 ECTC, s02p3C, pp. 54-57.
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7
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10444234289
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Creep and Fatigue Characterization of Lead Free 95.5Sn-3.8Ag-0.7Cu Solder
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J.H.L. Pang, B.S. Xiong, and T.H. Low, "Creep and Fatigue Characterization of Lead Free 95.5Sn-3.8Ag-0.7Cu Solder," Proceedings 2004 ECTC, s30p4, pp. 1333-1337.
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Proceedings 2004 ECTC, s30p4
, pp. 1333-1337
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Pang, J.H.L.1
Xiong, B.S.2
Low, T.H.3
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8
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10444253928
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Aging and Creep Behavior of Sn3.9Ag0.6Cu Solder Alloy
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Q. Xiao, L. Nguyen, and W.D. Armstrong, "Aging and Creep Behavior of Sn3.9Ag0.6Cu Solder Alloy," Proceedings 2004 ECTC, s30p3, pp. 1325-1332.
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Proceedings 2004 ECTC, s30p3
, pp. 1325-1332
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Xiao, Q.1
Nguyen, L.2
Armstrong, W.D.3
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9
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0038012878
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S. Wiese, E. Meusel, K-J. Wolter, Microstructural Dependence of Constitutive Properties of Eutectic SnAg and SnAgCu Solders, Proceedings 2003 ECTC, s05p3C, pp. 197-206.
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S. Wiese, E. Meusel, K-J. Wolter, "Microstructural Dependence of Constitutive Properties of Eutectic SnAg and SnAgCu Solders," Proceedings 2003 ECTC, s05p3C, pp. 197-206.
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10
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0037674774
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Bulk Solder and Solder Joint Properties for Lead Free 95.5Sn-3.8Ag-0.7Cu Solder Alloy
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J.H.L. Pang, B.S. Xiong, CC. Neo, X.R. Zang, and T.H. Low, "Bulk Solder and Solder Joint Properties for Lead Free 95.5Sn-3.8Ag-0.7Cu Solder Alloy," 2003 ECTC, s16p4C, pp. 673-679.
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(2003)
ECTC, s16p4C
, pp. 673-679
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Pang, J.H.L.1
Xiong, B.S.2
Neo, C.C.3
Zang, X.R.4
Low, T.H.5
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11
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0038011614
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Q. Zhang, A. Dasgupta, and P. Haswell, Viscoplastic Constitutive Properties and Energy-Partitioning Model of Lead-Free Sn3.9Ag0.6Cu Solder Alloy, Proceedings 2003 ECTC, s38p30C, pp. 1862-1868.
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Q. Zhang, A. Dasgupta, and P. Haswell, "Viscoplastic Constitutive Properties and Energy-Partitioning Model of Lead-Free Sn3.9Ag0.6Cu Solder Alloy," Proceedings 2003 ECTC, s38p30C, pp. 1862-1868.
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12
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4444272185
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Impression Creep Testing and Constitutive Modeling of Sn-based Solder Interconnects
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R.A. Marks, D. Pan, I. Dutta, and S.G. Jadhav, "Impression Creep Testing and Constitutive Modeling of Sn-based Solder Interconnects," Proceedings 2004 ITHERM, pp.95-102.
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Proceedings 2004 ITHERM
, pp. 95-102
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Marks, R.A.1
Pan, D.2
Dutta, I.3
Jadhav, S.G.4
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13
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4444223308
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Modified Anand Constitutive Model for Lead-Free Solder Sn-3.5Ag
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X. Chen, G. Chen, M. Sakane, "Modified Anand Constitutive Model for Lead-Free Solder Sn-3.5Ag," Proceedings 2004 ITHERM, pp.447-452.
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Proceedings 2004 ITHERM
, pp. 447-452
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Chen, X.1
Chen, G.2
Sakane, M.3
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14
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21044457162
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An Obstacle-Controlled Creep Model for Sn-Pb and Sn-Based Lead-Free Solders
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J.P. Clech, "An Obstacle-Controlled Creep Model for Sn-Pb and Sn-Based Lead-Free Solders," Proceedings 2004 SMTA International, pp. 776-802.
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Proceedings 2004 SMTA International
, pp. 776-802
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Clech, J.P.1
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15
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0026963395
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R. Darveaux and K. Banerji, Constitutive Relations for Tin Based Solder Joints, Proceedings IEEE 42nd ECTC, 1992, pp. 538-551, and IEEE Trans on CHMT, 15, No. 6, December 1992, pp. 1013-1024.
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R. Darveaux and K. Banerji, "Constitutive Relations for Tin Based Solder Joints," Proceedings IEEE 42nd ECTC, 1992, pp. 538-551, and IEEE Trans on CHMT, Vol. 15, No. 6, December 1992, pp. 1013-1024.
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16
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33750285340
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H.T. Ma, J.C. Suhling, P. Lall, M.J. Bozack, Reliability of the Aging Lead Free Solder Joint, Proc. 2006 ECTC, pp. 849-864.
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H.T. Ma, J.C. Suhling, P. Lall, M.J. Bozack, "Reliability of the Aging Lead Free Solder Joint," Proc. 2006 ECTC, pp. 849-864.
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17
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50349101252
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Ductile-to-Brittle Transition Strain Rate
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R. Darveaux and C. Reichman, "Ductile-to-Brittle Transition Strain Rate," Proc EPTC, 2006
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(2006)
Proc EPTC
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Darveaux, R.1
Reichman, C.2
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18
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35348900531
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Effect of Mild Aging on Solder Joint Interface Failure
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R. Darveaux, C. Reichman, P. Agrawal, and S.W. Cha, "Effect of Mild Aging on Solder Joint Interface Failure," Proc. Japan IEEE VLSI Packaging Workshop, 2006.
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(2006)
Proc. Japan IEEE VLSI Packaging Workshop
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Darveaux, R.1
Reichman, C.2
Agrawal, P.3
Cha, S.W.4
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21
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0027079228
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Deformation Mechanisms in Lead-Tin Alloys, Application to Solder Reliability in Electronic Packages
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K.L. Murty and I. Turlik, "Deformation Mechanisms in Lead-Tin Alloys, Application to Solder Reliability in Electronic Packages," Proceedings 1st Joint Conference on Electronic Packaging, ASME/JSME, 1992, pp. 309-318.
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(1992)
Proceedings 1st Joint Conference on Electronic Packaging, ASME/JSME
, pp. 309-318
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Murty, K.L.1
Turlik, I.2
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23
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0026378024
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Fatigue Analysis of Flip Chip Assemblies Using Thermal Stress Simulations and a Coffin-Manson Relation
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R. Darveaux and K. Banerji, "Fatigue Analysis of Flip Chip Assemblies Using Thermal Stress Simulations and a Coffin-Manson Relation," Proc. 41st IEEE ECTC, 1991, pp. 797-805.
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(1991)
Proc. 41st IEEE ECTC
, pp. 797-805
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Darveaux, R.1
Banerji, K.2
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24
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0034479828
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R. Darveaux, Effect of Simulation Methodology on Solder Joint Crack Growth Correlation, Proc 2000 ECTC, pp. 1048-1058.
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R. Darveaux, "Effect of Simulation Methodology on Solder Joint Crack Growth Correlation," Proc 2000 ECTC, pp. 1048-1058.
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25
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35348856091
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R. Darveaux, Effect of Assembly Stiffness and Solder Properties on Thermal Cycle Acceleration Factors, Proc. 11th International Workshop on Thermal Investigations of ICs and Systems (THERMINC), Belgirate, Lake Maggiore, Italy, 9/27 - 9/30 2005.
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R. Darveaux, "Effect of Assembly Stiffness and Solder Properties on Thermal Cycle Acceleration Factors," Proc. 11th International Workshop on Thermal Investigations of ICs and Systems (THERMINC), Belgirate, Lake Maggiore, Italy, 9/27 - 9/30 2005.
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