메뉴 건너뛰기




Volumn , Issue , 2007, Pages 695-706

Mechanical properties of lead-free solders

Author keywords

[No Author keywords available]

Indexed keywords

LEAD-FREE ALLOYS; TEMPERATURE CYCLING; TENSILE LOADING;

EID: 35348842657     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2007.373872     Document Type: Conference Paper
Times cited : (42)

References (25)
  • 1
    • 0001784769 scopus 로고
    • Reliability of Plastic Ball Grid Array Assembly
    • J. Lau Editor, McGraw-Hill, Inc, New York
    • R. Darveaux, K. Banerji, A. Mawer, and G. Dody, "Reliability of Plastic Ball Grid Array Assembly," Ball Grid Array Technology. J. Lau Editor, McGraw-Hill, Inc., New York, 1995.
    • (1995) Ball Grid Array Technology
    • Darveaux, R.1    Banerji, K.2    Mawer, A.3    Dody, G.4
  • 2
    • 24644469657 scopus 로고    scopus 로고
    • R. Darveaux, Shear Deformation of Lead Free Solder Joints, Proc. 2005 ECTC, pp. 882-893.
    • R. Darveaux, "Shear Deformation of Lead Free Solder Joints," Proc. 2005 ECTC, pp. 882-893.
  • 3
    • 70350324728 scopus 로고    scopus 로고
    • Mechanical Testing of Solder Joint Arrays versus Bulk Solder Specimens
    • R. Darveaux, "Mechanical Testing of Solder Joint Arrays versus Bulk Solder Specimens," Proc. SMTAI, 2006.
    • (2006) Proc. SMTAI
    • Darveaux, R.1
  • 4
    • 10444236402 scopus 로고    scopus 로고
    • Accumulated Creep Strain and Energy Density Based Thermal Fatigue Life Prediction Models for SnAgCu Solder Joints
    • A. Syed, "Accumulated Creep Strain and Energy Density Based Thermal Fatigue Life Prediction Models for SnAgCu Solder Joints," Proceedings ECTC 2004, s16p7, pp. 737-746.
    • Proceedings ECTC 2004, s16p7 , pp. 737-746
    • Syed, A.1
  • 5
    • 0038109900 scopus 로고    scopus 로고
    • J. Lau, W. Dauksher, and P. Vianco, Acceleration Models, Constitutive Equations, and Reliability of Lead-Free Solders and Joints, Proceedings 2003 ECTC, s05p7C, pp. 229-236.
    • J. Lau, W. Dauksher, and P. Vianco, "Acceleration Models, Constitutive Equations, and Reliability of Lead-Free Solders and Joints," Proceedings 2003 ECTC, s05p7C, pp. 229-236.
  • 6
    • 0038351738 scopus 로고    scopus 로고
    • J.W. Morris, Jr., H.G. Song, and F. Hua, Creep Properties of Sn-rich Solder Joints, Proceedings 2003 ECTC, s02p3C, pp. 54-57.
    • J.W. Morris, Jr., H.G. Song, and F. Hua, "Creep Properties of Sn-rich Solder Joints," Proceedings 2003 ECTC, s02p3C, pp. 54-57.
  • 7
    • 10444234289 scopus 로고    scopus 로고
    • Creep and Fatigue Characterization of Lead Free 95.5Sn-3.8Ag-0.7Cu Solder
    • J.H.L. Pang, B.S. Xiong, and T.H. Low, "Creep and Fatigue Characterization of Lead Free 95.5Sn-3.8Ag-0.7Cu Solder," Proceedings 2004 ECTC, s30p4, pp. 1333-1337.
    • Proceedings 2004 ECTC, s30p4 , pp. 1333-1337
    • Pang, J.H.L.1    Xiong, B.S.2    Low, T.H.3
  • 9
    • 0038012878 scopus 로고    scopus 로고
    • S. Wiese, E. Meusel, K-J. Wolter, Microstructural Dependence of Constitutive Properties of Eutectic SnAg and SnAgCu Solders, Proceedings 2003 ECTC, s05p3C, pp. 197-206.
    • S. Wiese, E. Meusel, K-J. Wolter, "Microstructural Dependence of Constitutive Properties of Eutectic SnAg and SnAgCu Solders," Proceedings 2003 ECTC, s05p3C, pp. 197-206.
  • 10
    • 0037674774 scopus 로고    scopus 로고
    • Bulk Solder and Solder Joint Properties for Lead Free 95.5Sn-3.8Ag-0.7Cu Solder Alloy
    • J.H.L. Pang, B.S. Xiong, CC. Neo, X.R. Zang, and T.H. Low, "Bulk Solder and Solder Joint Properties for Lead Free 95.5Sn-3.8Ag-0.7Cu Solder Alloy," 2003 ECTC, s16p4C, pp. 673-679.
    • (2003) ECTC, s16p4C , pp. 673-679
    • Pang, J.H.L.1    Xiong, B.S.2    Neo, C.C.3    Zang, X.R.4    Low, T.H.5
  • 11
    • 0038011614 scopus 로고    scopus 로고
    • Q. Zhang, A. Dasgupta, and P. Haswell, Viscoplastic Constitutive Properties and Energy-Partitioning Model of Lead-Free Sn3.9Ag0.6Cu Solder Alloy, Proceedings 2003 ECTC, s38p30C, pp. 1862-1868.
    • Q. Zhang, A. Dasgupta, and P. Haswell, "Viscoplastic Constitutive Properties and Energy-Partitioning Model of Lead-Free Sn3.9Ag0.6Cu Solder Alloy," Proceedings 2003 ECTC, s38p30C, pp. 1862-1868.
  • 12
    • 4444272185 scopus 로고    scopus 로고
    • Impression Creep Testing and Constitutive Modeling of Sn-based Solder Interconnects
    • R.A. Marks, D. Pan, I. Dutta, and S.G. Jadhav, "Impression Creep Testing and Constitutive Modeling of Sn-based Solder Interconnects," Proceedings 2004 ITHERM, pp.95-102.
    • Proceedings 2004 ITHERM , pp. 95-102
    • Marks, R.A.1    Pan, D.2    Dutta, I.3    Jadhav, S.G.4
  • 13
    • 4444223308 scopus 로고    scopus 로고
    • Modified Anand Constitutive Model for Lead-Free Solder Sn-3.5Ag
    • X. Chen, G. Chen, M. Sakane, "Modified Anand Constitutive Model for Lead-Free Solder Sn-3.5Ag," Proceedings 2004 ITHERM, pp.447-452.
    • Proceedings 2004 ITHERM , pp. 447-452
    • Chen, X.1    Chen, G.2    Sakane, M.3
  • 14
    • 21044457162 scopus 로고    scopus 로고
    • An Obstacle-Controlled Creep Model for Sn-Pb and Sn-Based Lead-Free Solders
    • J.P. Clech, "An Obstacle-Controlled Creep Model for Sn-Pb and Sn-Based Lead-Free Solders," Proceedings 2004 SMTA International, pp. 776-802.
    • Proceedings 2004 SMTA International , pp. 776-802
    • Clech, J.P.1
  • 15
    • 0026963395 scopus 로고    scopus 로고
    • R. Darveaux and K. Banerji, Constitutive Relations for Tin Based Solder Joints, Proceedings IEEE 42nd ECTC, 1992, pp. 538-551, and IEEE Trans on CHMT, 15, No. 6, December 1992, pp. 1013-1024.
    • R. Darveaux and K. Banerji, "Constitutive Relations for Tin Based Solder Joints," Proceedings IEEE 42nd ECTC, 1992, pp. 538-551, and IEEE Trans on CHMT, Vol. 15, No. 6, December 1992, pp. 1013-1024.
  • 16
    • 33750285340 scopus 로고    scopus 로고
    • H.T. Ma, J.C. Suhling, P. Lall, M.J. Bozack, Reliability of the Aging Lead Free Solder Joint, Proc. 2006 ECTC, pp. 849-864.
    • H.T. Ma, J.C. Suhling, P. Lall, M.J. Bozack, "Reliability of the Aging Lead Free Solder Joint," Proc. 2006 ECTC, pp. 849-864.
  • 17
    • 50349101252 scopus 로고    scopus 로고
    • Ductile-to-Brittle Transition Strain Rate
    • R. Darveaux and C. Reichman, "Ductile-to-Brittle Transition Strain Rate," Proc EPTC, 2006
    • (2006) Proc EPTC
    • Darveaux, R.1    Reichman, C.2
  • 19
    • 33845567943 scopus 로고    scopus 로고
    • Interface Failure in Lead Free Solder Joints
    • May
    • R. Darveaux, C. Reichman, N. Islam, "Interface Failure in Lead Free Solder Joints," Proc. ECTC, May 2006.
    • (2006) Proc. ECTC
    • Darveaux, R.1    Reichman, C.2    Islam, N.3
  • 23
    • 0026378024 scopus 로고
    • Fatigue Analysis of Flip Chip Assemblies Using Thermal Stress Simulations and a Coffin-Manson Relation
    • R. Darveaux and K. Banerji, "Fatigue Analysis of Flip Chip Assemblies Using Thermal Stress Simulations and a Coffin-Manson Relation," Proc. 41st IEEE ECTC, 1991, pp. 797-805.
    • (1991) Proc. 41st IEEE ECTC , pp. 797-805
    • Darveaux, R.1    Banerji, K.2
  • 24
    • 0034479828 scopus 로고    scopus 로고
    • R. Darveaux, Effect of Simulation Methodology on Solder Joint Crack Growth Correlation, Proc 2000 ECTC, pp. 1048-1058.
    • R. Darveaux, "Effect of Simulation Methodology on Solder Joint Crack Growth Correlation," Proc 2000 ECTC, pp. 1048-1058.
  • 25
    • 35348856091 scopus 로고    scopus 로고
    • R. Darveaux, Effect of Assembly Stiffness and Solder Properties on Thermal Cycle Acceleration Factors, Proc. 11th International Workshop on Thermal Investigations of ICs and Systems (THERMINC), Belgirate, Lake Maggiore, Italy, 9/27 - 9/30 2005.
    • R. Darveaux, "Effect of Assembly Stiffness and Solder Properties on Thermal Cycle Acceleration Factors," Proc. 11th International Workshop on Thermal Investigations of ICs and Systems (THERMINC), Belgirate, Lake Maggiore, Italy, 9/27 - 9/30 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.