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Volumn 2006, Issue , 2006, Pages 906-917

Interface failure in lead free solder joints

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACE FAILURE; INTERFACE MICROSTRUCTURE; JOINT STRENGTH; THERMAL AGING;

EID: 33845567943     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2006.1645763     Document Type: Conference Paper
Times cited : (70)

References (11)
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    • C.K. Wong, J.H.L. Pang, Y.F. Sun, F.L. Ng, J.W. Tew and W. Fan, "Influence of Solder Volume on Interfacial Reaction between Sn-Ag-Cu Solder and TiW/Cu/Ni UBM," Proc. 2005 EPIC, pp. 492-496.
    • Proc. 2005 EPIC , pp. 492-496
    • Wong, C.K.1    Pang, J.H.L.2    Sun, Y.F.3    Ng, F.L.4    Tew, J.W.5    Fan, W.6
  • 2
    • 33845577136 scopus 로고    scopus 로고
    • Thermomechanical fatigue behavior of selected lead-free solders
    • LF2-2
    • J. Bartelo et.al, "Thermomechanical Fatigue Behavior of Selected Lead-Free Solders," Proc. APEX 2001, LF2-2.
    • Proc. APEX 2001
    • Bartelo, J.1
  • 3
    • 33847337483 scopus 로고    scopus 로고
    • Solder joint integrity of various surface finished build-up flip chip packages by 4-point monotonic bending test
    • T. Nakamura, Y. Miyamoto, Y. Hosoi, and K. Newman, "Solder Joint Integrity of Various Surface Finished Build-Up Flip Chip Packages by 4-point Monotonic Bending Test," Proc. 2005 EPIC, pp. 465-270.
    • Proc. 2005 EPIC , pp. 465-1270
    • Nakamura, T.1    Miyamoto, Y.2    Hosoi, Y.3    Newman, K.4
  • 4
    • 33847258347 scopus 로고    scopus 로고
    • Effect of Ni-P thickness on the tensile strength of Cu/electroless Ni-P/Sn-3.5Ag solder joint
    • A. Kumar and Z. Chen, "Effect of Ni-P Thickness on the Tensile Strength of Cu/Electroless Ni-P/Sn-3.5Ag Solder Joint," Proc. 2005 EPTC, pp. 873-878.
    • Proc. 2005 EPTC , pp. 873-878
    • Kumar, A.1    Chen, Z.2
  • 5
    • 0002064823 scopus 로고
    • Effect of aging on the strength and ductility of controlled collapse solder joints
    • November
    • K. Banerji and R. Darveaux, "Effect of Aging on the Strength and Ductility of Controlled Collapse Solder Joints," Proc. TMS-AIME Symposium, November, 1992, pp. 431-442.
    • (1992) Proc. TMS-AIME Symposium , pp. 431-442
    • Banerji, K.1    Darveaux, R.2
  • 6
    • 0033354956 scopus 로고    scopus 로고
    • The effect of au plating thickness of BGA substrates on ball shear strength under reliability tests
    • S.C. Hung, P.J. Zheng, S.C. Lee, and J.J. Lee, "The Effect of Au Plating Thickness of BGA Substrates on Ball Shear Strength Under Reliability Tests," Proc. IEMT, 1999.
    • (1999) Proc. IEMT
    • Hung, S.C.1    Zheng, P.J.2    Lee, S.C.3    Lee, J.J.4
  • 7
    • 10644231004 scopus 로고    scopus 로고
    • Effect of thermal aging on board level drop reliability for Pb-free BGA packages
    • T-C Chiu, K. Zeng, R. Stierman, D. Edwards, and K. Ano, "Effect of Thermal Aging on Board Level Drop Reliability for Pb-free BGA Packages," Proc. 2004 ECTC, pp. 1256-1262.
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    • Chiu, T.-C.1    Zeng, K.2    Stierman, R.3    Edwards, D.4    Ano, K.5
  • 8
    • 0029218402 scopus 로고    scopus 로고
    • Effect of PCB finish on the reliability and wettability of ball grid array packages
    • E. Brandley and K. Banerji, "Effect of PCB Finish on the Reliability and Wettability of Ball Grid Array Packages," Proc. 1995 ECTC, pp 1028-1038.
    • Proc. 1995 ECTC , pp. 1028-1038
    • Brandley, E.1    Banerji, K.2
  • 10
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    • Thermal fatigue assessment of lead-free solder joints
    • Q. Yu and M. Shiratori, "Thermal Fatigue Assessment of Lead-Free Solder Joints," Proc. THERMINIC 2005, pp. 204-211.
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    • Yu, Q.1    Shiratori, M.2
  • 11
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    • BGA brittle fracture - Alternative solder joint integrity test methods
    • K. Newman, "BGA Brittle Fracture - Alternative Solder Joint Integrity Test Methods," Proc. 2005 ECTC, pp. 1194-1201.
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    • Newman, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.