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Volumn , Issue , 2003, Pages 229-236

Acceleration models, constitutive equations, and reliability of lead-free solders and joints

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY; COPPER; CREEP; LEAD; MATHEMATICAL MODELS; PRINTED CIRCUIT BOARDS; PROBABILITY; RELIABILITY; SOLDERED JOINTS;

EID: 0038109900     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (88)

References (14)
  • 2
    • 0002945236 scopus 로고
    • Solder joint fatigue in surface mount technology-state of the art
    • October
    • Lau, J. H., and D. Rice, "Solder Joint Fatigue in Surface Mount Technology - State of the Art", Solid State Technology, Vol. 28, October 1985, pp. 91-104.
    • (1985) Solid State Technology , vol.28 , pp. 91-104
    • Lau, J.H.1    Rice, D.2
  • 6
    • 85052551073 scopus 로고
    • Flip chip solder bump (FCSB) technology: An example
    • edited by D. Doane and P. Franzon, Van Nostrand Reinhold, New York, NY
    • Puttlitz, K., "Flip Chip Solder Bump (FCSB) Technology: An Example", in Multichip Module Technologies and Alternatives, edited by D. Doane and P. Franzon, Van Nostrand Reinhold, New York, NY, 1993, pp. 450-476.
    • (1993) Multichip Module Technologies and Alternatives , pp. 450-476
    • Puttlitz, K.1
  • 10
  • 14
    • 0037480865 scopus 로고    scopus 로고
    • Creep analysis and thermal-fatigue life prediction of the lead-free solder sealing ring of a photonic switch
    • December
    • Lau, J. H., Z. Mei, S. Pang, C. Amsden, J. Rayner, and S. Pan, "Creep Analysis and Thermal-Fatigue Life Prediction of the Lead-Free Solder Sealing Ring of a Photonic Switch", ASME Transactions, Journal of Electronic Packaging, Vol. 124, December 2002, pp. 403-410.
    • (2002) ASME Transactions, Journal of Electronic Packaging , vol.124 , pp. 403-410
    • Lau, J.H.1    Mei, Z.2    Pang, S.3    Amsden, C.4    Rayner, J.5    Pan, S.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.