Quantum mechanical treatment of Si-O bond breakage in silica under time dependent dielectric breakdown testing

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2007, Pages 209-216

  McPherson, J W ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

Anode hole injection; Hydrogen release; Mie Gr neisen potential; TDDB; WKB

Indexed keywords

CHEMICAL BONDS; EIGENVALUES AND EIGENFUNCTIONS; ELECTRIC BREAKDOWN; ELECTRIC FIELD EFFECTS; POTENTIAL ENERGY FUNCTIONS; QUANTUM THEORY; THERMIONIC EMISSION;

ANODE HOLE INJECTION; BOND BREAKAGE; BOUND STATE ENERGY; HYDROGEN RELEASE; TUNNELING PROBABILITY;

SILICA;

EID: 34548755094     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2007.369893     Document Type: Conference Paper

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