-
1
-
-
0002576616
-
-
M. Hiroi, M. Tada, H. Ohtake, S. Saito, T. Onodera, N. Frutake, T. Harada, and Y. Hayashi: Proc. Int. Interconnect Technology Conf., 2001, p. 295.
-
(2001)
Proc. Int. Interconnect Technology Conf
, pp. 295
-
-
Hiroi, M.1
Tada, M.2
Ohtake, H.3
Saito, S.4
Onodera, T.5
Frutake, N.6
Harada, T.7
Hayashi, Y.8
-
2
-
-
34548786279
-
-
H. Ohtake, M. Tagami, K. Arita, and Y. Hayashi: Proc. Int. Interconnect Technology Conf., 2003, p. 245.
-
(2003)
Proc. Int. Interconnect Technology Conf
, pp. 245
-
-
Ohtake, H.1
Tagami, M.2
Arita, K.3
Hayashi, Y.4
-
3
-
-
3843073043
-
-
M. Bhave, K. Edwards, C. Washburn, S. Takei, Y. Sakaida, and Y. Nakajima: Proc. SPIE 5376 (2004) 640.
-
(2004)
Proc. SPIE
, vol.5376
, pp. 640
-
-
Bhave, M.1
Edwards, K.2
Washburn, C.3
Takei, S.4
Sakaida, Y.5
Nakajima, Y.6
-
4
-
-
0038352554
-
-
Y. Wang, X. Wu, G. Xu, J. Lamb, J. Sullivan, J. Claypool, J. Backus, S. Trautman, X. Shao, S. Takei, Y. Sone, K. Mizusawa, and H. Fukuro: Proc. SPIE 4345 (2001) 838.
-
(2001)
Proc. SPIE
, vol.4345
, pp. 838
-
-
Wang, Y.1
Wu, X.2
Xu, G.3
Lamb, J.4
Sullivan, J.5
Claypool, J.6
Backus, J.7
Trautman, S.8
Shao, X.9
Takei, S.10
Sone, Y.11
Mizusawa, K.12
Fukuro, H.13
-
6
-
-
0344494546
-
-
T. Yokayama, K. Shiba, A. Nishizawa, S. Nagahara, H. Yamato, T. Usami, S. Watanabe, K. Nakabeppu, Y. Kunimune, M. Sekine, N. Oda, and T. Horiuchi: Jpn. J. Appl. Phys. 42 (2003) 5543.
-
(2003)
Jpn. J. Appl. Phys
, vol.42
, pp. 5543
-
-
Yokayama, T.1
Shiba, K.2
Nishizawa, A.3
Nagahara, S.4
Yamato, H.5
Usami, T.6
Watanabe, S.7
Nakabeppu, K.8
Kunimune, Y.9
Sekine, M.10
Oda, N.11
Horiuchi, T.12
-
9
-
-
0032181653
-
-
M. B. Anand, N. Nakamura, J. Wada, Y. Oikawa, T. Katata, K. Shiba, and H. Shibata: Jpn. J. Appl. Phys. 37 (1998) 5526.
-
(1998)
Jpn. J. Appl. Phys
, vol.37
, pp. 5526
-
-
Anand, M.B.1
Nakamura, N.2
Wada, J.3
Oikawa, Y.4
Katata, T.5
Shiba, K.6
Shibata, H.7
-
10
-
-
0346328674
-
-
J. Abe, H. Hayashi, D. Kishigami, Y. Sato, E. Shiobara, T. Shibata, Y. Onishi, and T. Ohiwa: Jpn. J. Appl. Phys. 42 (2003) 6605.
-
(2003)
Jpn. J. Appl. Phys
, vol.42
, pp. 6605
-
-
Abe, J.1
Hayashi, H.2
Kishigami, D.3
Sato, Y.4
Shiobara, E.5
Shibata, T.6
Onishi, Y.7
Ohiwa, T.8
-
11
-
-
24644519815
-
-
T. Shinjo, S. Takei, Y. Sakaida, A. Qin, and Y. Nakajima: Proc. SPIE 5753 (2005) 636.
-
(2005)
Proc. SPIE
, vol.5753
, pp. 636
-
-
Shinjo, T.1
Takei, S.2
Sakaida, Y.3
Qin, A.4
Nakajima, Y.5
-
16
-
-
33745627516
-
-
S. Takei, T. Shinjo, Y. Sakaida, Y. Horiguchi, and Y. Nakajima: Proc. SPIE 6153 (2006) 61532Q.
-
(2006)
Proc. SPIE
, vol.6153
-
-
Takei, S.1
Shinjo, T.2
Sakaida, Y.3
Horiguchi, Y.4
Nakajima, Y.5
-
17
-
-
3843147181
-
-
H. Wu, Z. Xiang, A. Hishida, D. Abdallah, J. Shan, E. Gonzalez, S. Ding, and M. Nasser: Proc. SPIE 5376 (2004) 697.
-
(2004)
Proc. SPIE
, vol.5376
, pp. 697
-
-
Wu, H.1
Xiang, Z.2
Hishida, A.3
Abdallah, D.4
Shan, J.5
Gonzalez, E.6
Ding, S.7
Nasser, M.8
-
18
-
-
24644439703
-
-
B. Li, K. Do, J. Stuck, S. Xie, R. Leung, T. Hguyen, J. Gill, L. Jin, W. Fan, S. Thanawala, F. Zhou, N. Iwamoto, E. Brouk, and J. Kennedy: Proc. SPIE 5753 (2005) 449.
-
(2005)
Proc. SPIE
, vol.5753
, pp. 449
-
-
Li, B.1
Do, K.2
Stuck, J.3
Xie, S.4
Leung, R.5
Hguyen, T.6
Gill, J.7
Jin, L.8
Fan, W.9
Thanawala, S.10
Zhou, F.11
Iwamoto, N.12
Brouk, E.13
Kennedy, J.14
|