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Volumn 41, Issue 4 A, 2002, Pages

Dry etching of organic low dielectric constant film without etch stop layer

Author keywords

Damascene; Dielectric constant material; Dry etch; Etch stop layer; Low k; Organic film; Subtrenching

Indexed keywords

DRY ETCHING; ELECTRON CYCLOTRON RESONANCE; PERMITTIVITY; PLASMA ETCHING;

EID: 0036544487     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.l425     Document Type: Article
Times cited : (2)

References (5)
  • 1
    • 0009779685 scopus 로고    scopus 로고
    • SiLK is a trademark of The Dow Chemical Company


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.