Surface structure of molecular beam epitaxy (211)B HgCdTe

Journal of Electronic Materials

Volumn 36, Issue 8, 2007, Pages 949-957

  Benson, J D ^a   Almeida, L A ^a   Carmody, M W ^b   Edwall, D D ^b   Markunas, J K ^a   Jacobs, R N ^a   Martinka, M ^a   Lee, U ^c  

^a US Army Research Development and Engineering Command   (United States)

^b TELEDYNE SCIENTIFIC COMPANY   (United States)

^c U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

Atomic force microscopy; CdTe Si; Cross hatch; HgCdTe; Molecular beam epitaxy; Nano ripple; Nano wire

Indexed keywords

CROSS-HATCH PATTERNING; EPILAYER MISMATCH; NANORIPPLES;

ATOMIC FORCE MICROSCOPY; MERCURY COMPOUNDS; NANOWIRES; SEMICONDUCTING CADMIUM TELLURIDE; SURFACE TOPOGRAPHY; WAVELENGTH;

MOLECULAR BEAM EPITAXY;

EID: 34548207752     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-007-0143-3     Document Type: Conference Paper

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