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Volumn 102, Issue 3, 2007, Pages

Theory of superfast fronts of impact ionization in semiconductor structures

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; ELECTRIC FIELD EFFECTS; IMPACT IONIZATION;

EID: 34548010795     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2767378     Document Type: Article
Times cited : (22)

References (42)
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    • Generally, emission from deep-level centers can create nontrivial and nonstationary profile of initial carriers in the n base. However, our theory reveals weak logarithmic dependence of all major front parameters on n0 and p0. This justifies our assumption that n0 and p0 maintain constant values in the depleted region.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.