Silicon diodes in avalanche pulse-sharpening applications

IEEE Transactions on Plasma Science

Volumn 25, Issue 2, 1997, Pages 138-144

  Focia, Ronald J ^a   Schamiloglu, Edl ^a   Fleddermann, Charles B ^a   Agee, F J ^a   Gaudet, J ^a  

^a University of New Mexico   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC IMPEDANCE; PLASMA DENSITY; PLASMA DIODES; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS;

SILICON AVALANCHE SHAPER (SAS) DIODES; TRAPPED PLASMA AVALANCHE TRIGGERED TRANSIT (TRAPPATT) DIODES;

SEMICONDUCTOR SWITCHES;

EID: 0031125604     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/27.602484     Document Type: Article

References (18)

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