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Volumn 29, Issue 4, 2007, Pages 185-195

FIB/SEM characterization of carbon-based fibers

Author keywords

Composites (carbon fibers and carbon precursors); Cross sectional techniques; Focused ion beam (FIB); Metrology (spatial dimensions measurement); Scanning electron microscope (SEM)

Indexed keywords

CARBON FIBERS; CHARACTERIZATION; ELECTRIC PROPERTIES; POLYACRYLONITRILES; SCANNING ELECTRON MICROSCOPY;

EID: 34547930326     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.20062     Document Type: Article
Times cited : (5)

References (36)
  • 2
    • 0034943437 scopus 로고    scopus 로고
    • Focused ion beam techniques for the analysis of biological samples: A revolution in ultramicroscopy?
    • Ballerini M, Milani M, Squadrini F: Focused ion beam techniques for the analysis of biological samples: A revolution in ultramicroscopy? Proc Soc Photo Opt Instrum Eng 4261, 92 (2003).
    • (2003) Proc Soc Photo Opt Instrum Eng , vol.4261 , pp. 92
    • Ballerini, M.1    Milani, M.2    Squadrini, F.3
  • 3
    • 4544244585 scopus 로고    scopus 로고
    • Errors in nanometrology by SEM
    • Cazaux J: Errors in nanometrology by SEM. Nanotechnology 15, 1195 (2004).
    • (2004) Nanotechnology , vol.15 , pp. 1195
    • Cazaux, J.1
  • 4
    • 0033906874 scopus 로고    scopus 로고
    • Carbon fibers for composites
    • Chand S: Carbon fibers for composites. J Mater Sci 35, 1303 (2000).
    • (2000) J Mater Sci , vol.35 , pp. 1303
    • Chand, S.1
  • 5
    • 33645970251 scopus 로고    scopus 로고
    • Non-linearities and data analysis: Towards a quantitative investigation of delayed luminescence
    • Ciardi A, Milani M: Non-linearities and data analysis: towards a quantitative investigation of delayed luminescence. Hum Exp Toxicol 25, 141 (2006).
    • (2006) Hum Exp Toxicol , vol.25 , pp. 141
    • Ciardi, A.1    Milani, M.2
  • 6
    • 0242581063 scopus 로고
    • Scanning ion beam techniques for the examination of microelectronic devices
    • Cleaver JRA, Kirk ECG, Young RJ, Ahmed H: Scanning ion beam techniques for the examination of microelectronic devices. J Vac Sci Technol B 6, 1026 (1988).
    • (1988) J Vac Sci Technol B , vol.6 , pp. 1026
    • Cleaver, J.R.A.1    Kirk, E.C.G.2    Young, R.J.3    Ahmed, H.4
  • 8
    • 0031628196 scopus 로고    scopus 로고
    • The effect of processing on the structure and properties of carbon fibers
    • Edie DD: The effect of processing on the structure and properties of carbon fibers. Carbon 36, 345 (1998).
    • (1998) Carbon , vol.36 , pp. 345
    • Edie, D.D.1
  • 9
    • 0032681352 scopus 로고    scopus 로고
    • Plasma treatment of pitch-based ultra high modulus carbon fibers
    • Fukunaga A, Komami T, Ueda S, Nagumo M: Plasma treatment of pitch-based ultra high modulus carbon fibers. Carbon 37, 1087 (1999).
    • (1999) Carbon , vol.37 , pp. 1087
    • Fukunaga, A.1    Komami, T.2    Ueda, S.3    Nagumo, M.4
  • 10
    • 84892224035 scopus 로고    scopus 로고
    • Giannuzzi LA, Stevie FA eds, Springer: New York
    • Giannuzzi LA, Stevie FA (eds). Introduction to Focused Ion Beams, Springer: New York (2005).
    • (2005) Introduction to Focused Ion Beams
  • 12
    • 0029283879 scopus 로고
    • Focused-Ion-Beam digging of biological specimens
    • Ishitani T, Hirose H, Tsuboi H: Focused-Ion-Beam digging of biological specimens. J Electron Microsc 44, 110 (1995).
    • (1995) J Electron Microsc , vol.44 , pp. 110
    • Ishitani, T.1    Hirose, H.2    Tsuboi, H.3
  • 13
    • 0031396601 scopus 로고    scopus 로고
    • Objective comparison of scanning ion and scanning electron microscope images
    • Ishitani T, Tsuboi H: Objective comparison of scanning ion and scanning electron microscope images. Scanning 19, 489 (1997).
    • (1997) Scanning , vol.19 , pp. 489
    • Ishitani, T.1    Tsuboi, H.2
  • 14
    • 0022685419 scopus 로고
    • Structure-property relationships in carbon fibres
    • Johnson DJ: Structure-property relationships in carbon fibres. J Phys D: Appl Phys 20, 286 (1987).
    • (1987) J Phys D: Appl Phys , vol.20 , pp. 286
    • Johnson, D.J.1
  • 15
    • 0030159407 scopus 로고    scopus 로고
    • Low voltage scanning electron microscopy
    • Joy DC, Joy CS: Low voltage scanning electron microscopy. Micron 27, 247 (1996).
    • (1996) Micron , vol.27 , pp. 247
    • Joy, D.C.1    Joy, C.S.2
  • 16
    • 84985232979 scopus 로고
    • The use of polarized light microscope in examining the structure of carbon fibers
    • Knibbs RH. The use of polarized light microscope in examining the structure of carbon fibers. J Micros Oxford 94, 273 (1971).
    • (1971) J Micros Oxford , vol.94 , pp. 273
    • Knibbs, R.H.1
  • 17
    • 0027333925 scopus 로고
    • Carbon fiber compressive strength and its dependence on structure and morphology
    • Kumar S, Anderson DP, Crasto AS: Carbon fiber compressive strength and its dependence on structure and morphology. J Mater Sci 28, 423 (1993).
    • (1993) J Mater Sci , vol.28 , pp. 423
    • Kumar, S.1    Anderson, D.P.2    Crasto, A.S.3
  • 18
    • 0032028820 scopus 로고    scopus 로고
    • Failure analysis of high power GaAs-based lasers using electron beam induced current analysis and transmission electron microscopy
    • Mallard RE, Clayton R, Mayer D, Hobbs L: Failure analysis of high power GaAs-based lasers using electron beam induced current analysis and transmission electron microscopy. J Vac Sci Technol A 16, 825 (1998).
    • (1998) J Vac Sci Technol A , vol.16 , pp. 825
    • Mallard, R.E.1    Clayton, R.2    Mayer, D.3    Hobbs, L.4
  • 21
    • 29144498252 scopus 로고    scopus 로고
    • Focused ion beam characterization of plasma-assisted deposition on polymer films at the nanoscale
    • Milani M, Riccardi C, Drobne D, Ciardi A, Esena P, et al.: Focused ion beam characterization of plasma-assisted deposition on polymer films at the nanoscale. Scanning 27, 275 (2005b).
    • (2005) Scanning , vol.27 , pp. 275
    • Milani, M.1    Riccardi, C.2    Drobne, D.3    Ciardi, A.4    Esena, P.5
  • 22
    • 0037378223 scopus 로고    scopus 로고
    • Simulation study of secondary electron images in scanning ion microscopy
    • Ohya T, Ishitani T: Simulation study of secondary electron images in scanning ion microscopy. Nucl Instrum Meth B 202, 305 (2003).
    • (2003) Nucl Instrum Meth B , vol.202 , pp. 305
    • Ohya, T.1    Ishitani, T.2
  • 23
    • 36448999735 scopus 로고
    • High resolution focused ion beams
    • Orloff J: High resolution focused ion beams. Rev Sci Instrum 64, 1105 (1993).
    • (1993) Rev Sci Instrum , vol.64 , pp. 1105
    • Orloff, J.1
  • 25
    • 0034844206 scopus 로고    scopus 로고
    • Crosssectional texture of carbon fibres analysed by scanning microbeam X-ray diffraction
    • Paris O, Loidl D, Muller M, Lichtenegger H, Peterlik H: Crosssectional texture of carbon fibres analysed by scanning microbeam X-ray diffraction. J Appl Cryst 34, 473 (2001).
    • (2001) J Appl Cryst , vol.34 , pp. 473
    • Paris, O.1    Loidl, D.2    Muller, M.3    Lichtenegger, H.4    Peterlik, H.5
  • 26
    • 1842478867 scopus 로고    scopus 로고
    • Liquid water transport in gas diffusion layer of polymer electrolyte fuel cells
    • Pasaogullari U, Wang CY: Liquid water transport in gas diffusion layer of polymer electrolyte fuel cells. J Electrochem Soc 151, A399 (2004).
    • (2004) J Electrochem Soc , vol.151
    • Pasaogullari, U.1    Wang, C.Y.2
  • 27
    • 3543056495 scopus 로고    scopus 로고
    • Oxydized (cyclized) polyacrylonitrile fibres-oxypan. A review
    • Perepelkin KE: Oxydized (cyclized) polyacrylonitrile fibres-oxypan. A review. Fibre Chem 35, 409 (2003).
    • (2003) Fibre Chem , vol.35 , pp. 409
    • Perepelkin, K.E.1
  • 28
    • 0033007641 scopus 로고    scopus 로고
    • Applications of focused ion beam microscopy to materials science specimens
    • Phaneuf MW: Applications of focused ion beam microscopy to materials science specimens. Micron 30, 277 (1999).
    • (1999) Micron , vol.30 , pp. 277
    • Phaneuf, M.W.1
  • 29
    • 0035126675 scopus 로고    scopus 로고
    • TOF-SIMS studies of carbon fibre composite fracture surfaces and the development of controlled mode in situ fracture
    • Prickett AC, Smith PA, Watts JF: TOF-SIMS studies of carbon fibre composite fracture surfaces and the development of controlled mode in situ fracture. Surf Interf Anal 31, 11 (2000).
    • (2000) Surf Interf Anal , vol.31 , pp. 11
    • Prickett, A.C.1    Smith, P.A.2    Watts, J.F.3
  • 31
    • 33644539181 scopus 로고    scopus 로고
    • A new approach to studying biological and soft Materials Using Focused Ion Beam Scanning Electron Microscopy (FIB SEM)
    • Stokes DJ, Morissey F, Lich BH: A new approach to studying biological and soft Materials Using Focused Ion Beam Scanning Electron Microscopy (FIB SEM). J Phys Conf Ser 26, 50 (2006).
    • (2006) J Phys Conf Ser , vol.26 , pp. 50
    • Stokes, D.J.1    Morissey, F.2    Lich, B.H.3
  • 32
    • 2942633835 scopus 로고    scopus 로고
    • Image formation in Low vacuum SEM
    • Thiel BL: Image formation in Low vacuum SEM. Microchim Acta 145, 243 (2004).
    • (2004) Microchim Acta , vol.145 , pp. 243
    • Thiel, B.L.1
  • 33
    • 0142031510 scopus 로고    scopus 로고
    • Evolution of structure and properties of PAN precursors during their conversion to carbon fibers
    • Wangxi Z, Jie L, Gang W: Evolution of structure and properties of PAN precursors during their conversion to carbon fibers. Carbon 41, 2805 (2003).
    • (2003) Carbon , vol.41 , pp. 2805
    • Wangxi, Z.1    Jie, L.2    Gang, W.3
  • 34
    • 85053570936 scopus 로고    scopus 로고
    • FIB/lift-out TEM cross sections of block copolymer films ordered on silicon substrates
    • White H, Pu Y, Rafailovich M, Sokolov J, King AH, et al.: FIB/lift-out TEM cross sections of block copolymer films ordered on silicon substrates. Polymer 42, 1613 (2000).
    • (2000) Polymer , vol.42 , pp. 1613
    • White, H.1    Pu, Y.2    Rafailovich, M.3    Sokolov, J.4    King, A.H.5
  • 35
    • 0027363380 scopus 로고
    • An application of scanned focused ion beam milling to studies on the internal morphology of small arthropods
    • Yang RJ, Dingle TJ, Robinson K, Pugh PJA: An application of scanned focused ion beam milling to studies on the internal morphology of small arthropods. J Micros Oxford 172, 81 (1993).
    • (1993) J Micros Oxford , vol.172 , pp. 81
    • Yang, R.J.1    Dingle, T.J.2    Robinson, K.3    Pugh, P.J.A.4
  • 36
    • 0000864708 scopus 로고    scopus 로고
    • Edge detection techniques: An overview
    • Ziou D, Tabbone S: Edge detection techniques: an overview. Int J Pattern Recogn 8, 537 (1998).
    • (1998) Int J Pattern Recogn , vol.8 , pp. 537
    • Ziou, D.1    Tabbone, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.