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Volumn 145, Issue 1-4, 2004, Pages 243-247

Image formation in low vacuum SEM

Author keywords

Charging insulators; Dielectrics; Low vacuum SEM; Positive ions

Indexed keywords

ION;

EID: 2942633835     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00604-003-0161-7     Document Type: Conference Paper
Times cited : (1)

References (13)
  • 2
    • 0346824007 scopus 로고
    • Johari O M (ed) ITT Research Institute Chicago
    • Shaffner T J (1973) Scanning electron microscopy. In: Johari O M (ed) ITT Research Institute Chicago, pp 293-300
    • (1973) Scanning Electron Microscopy , pp. 293-300
    • Shaffner, T.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.