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Volumn 90, Issue 14, 2006, Pages 2087-2098
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Passivation and etching of fine-grained polycrystalline silicon films by hydrogen treatment
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Author keywords
Hydrogenation; Plasma; Polycrystalline silicon
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
CRYSTAL DEFECTS;
ELECTRIC POTENTIAL;
ETCHING;
GRAIN GROWTH;
HEAT TREATMENT;
HYDROGEN;
HYDROGENATION;
PASSIVATION;
PLASMAS;
SILICON NITRIDE;
TEMPERATURE DISTRIBUTION;
DEFECTS PASSIVATION;
HYDROGEN PLASMA;
SURFACE ETCHING;
POLYSILICON;
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EID: 33744985794
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solmat.2006.02.004 Document Type: Article |
Times cited : (24)
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References (17)
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