Scanning nonlinear dielectric microscope with super high resolution

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 7 B, 2007, Pages 4428-4434

  Cho, Yasuo ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Electric dipole moment; Ferroelectric data storage; Ferroelectric domain; Flash memory; Scanning nonlinear dielectric microscopy

Indexed keywords

CAPACITANCE; FERROELECTRIC MATERIALS; FLASH MEMORY; IMAGING TECHNIQUES; LIGHT POLARIZATION;

FERROELECTRIC DATA STORAGE; FERROELECTRIC DOMAIN; SCANNING NONLINEAR DIELECTRIC MICROSCOPY;

SCANNING ELECTRON MICROSCOPY;

EID: 34547897646     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.4428     Document Type: Article

References (24)

1. Y. Cho, A. Kirihara, and T. Saeki: Denshi Joho Tsushin Gakkai Ronbunshi J78-C1 (1995) 593 [in Japanese].
2. Y. Cho, A. Kirihara, and T. Saeki: Rev. Sci. Instrum. 67 (1996) 2297.
3. Y. Cho, S. Atsumi, and K. Nakamura: Jpn. J. Appl. Phys. 36 (1997) 3152.
4. Y. Cho, S. Kazuta, and K. Matsuura: Appl. Phys. Lett. 75 (1999) 2833.
5. H. Odagawa and Y. Cho: Surf. Sci. 463 (2000) L621.
6. T. Morita and Y. Cho: Jpn. J. Appl. Phys. 45 (2006) 4489.
7. A. Gruverman, O. Auciello, R. Ramesh, and H. Tokumoto: Nano- echnology 8 (1997) A38.
8. L. M. Eng, H.-J, Güntherodt, G. A. Schneider, U. Köpke, and J. M. Saldaña: Appl. Phys. Lett. 74 (1999) 233.
9. K. Honda and Y. Cho: Appl. Phys. Lett. 86 (2005) 013501.
10. K. Honda, S. Hashimoto, and Y. Cho: Appl. Phys. Lett. 86 (2005) 063515.
11. K. Honda, S. Hashimoto, and Y. Cho: Nanotechnology 16 (2005) 90.
12. K. Honda, S. Hashimoto, and Y. Cho: Nanotechnology 17 (2006) S185.
13. Y. Cho and K. Ohara: Appl. Phys. Lett. 79 (2001) 3842.
14. K. Ohara and Y. Cho: Nanotechnology 16 (2005) 54.
15. H. E. Ruda and A. Shik: Phys. Rev. B 67 (2003) 235309.
16. H. E. Ruda and A. Shik: Phys. Rev. B 71 (2005) 075316.
17. R. Hirose, K. Ohara, and Y. Cho: Nanotechnology 18 (2007) 084014.
18. H. Odagawa and Y. Cho: Appl. Phys. Lett. 80 (2002) 2159.
19. T. Sugihara, H. Odagawa, and Y. Cho: Jpn. J. Appl. Phys. 44 (2005) 4325.
20. T. Sugihara and Y. Cho: Nanotechnology 17 (2006) S162.
21. Y. Cho, S. Hashimoto, N. Odagawa, K. Tanaka, and Y. Hiranaga: Appl. Phys. Lett. 87 (2005) 232907.
22. Y. Cho, S. Hashimoto, N. Odagawa, K. Tanaka, and Y. Hiranaga: Nanotechnology 17 (2006) S137.
23. Y. Nakagawa: in Roadmap of Scanning Probe Microscopy, ed. S. Morita (Springer, New York, 2006) p. 39.
24. K. Ohara and Y. Cho: J. Appl. Phys. 96 (2004) 7460.