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Volumn 71, Issue 7, 2005, Pages

Scanning capacitance microscopy of nanostructures

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DOPING; ELECTRIC FIELD; GEOMETRY; MATERIAL STATE; MATHEMATICAL ANALYSIS; NANOWIRE; POLARIZATION; QUANTUM DOT; QUANTUM WELL; SCANNING ELECTRON MICROSCOPY;

EID: 15744368579     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.075316     Document Type: Article
Times cited : (9)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.