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Volumn 71, Issue 7, 2005, Pages
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Scanning capacitance microscopy of nanostructures
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
DOPING;
ELECTRIC FIELD;
GEOMETRY;
MATERIAL STATE;
MATHEMATICAL ANALYSIS;
NANOWIRE;
POLARIZATION;
QUANTUM DOT;
QUANTUM WELL;
SCANNING ELECTRON MICROSCOPY;
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EID: 15744368579
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.71.075316 Document Type: Article |
Times cited : (9)
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References (13)
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