Post-buckling dynamic behavior of self-assembled 3D microstructures

Microsystem Technologies

Volumn 14, Issue 1, 2008, Pages 69-78

  Buchaillot, Lionel ^a   Millet, Olivier ^a   Quévy, Emmanuel ^a   Collard, Dominique ^b  

^a INSTITUT D ELECTRONIQUE   (France)

^b INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BUCKLING; DAMPING; MEMS; MOLECULAR DYNAMICS; SELF ASSEMBLED MONOLAYERS;

3D MICROSTRUCTURES; BEAM DIMENSION; POST-BUCKLING; RESONANCE FREQUENCIES;

MICROSTRUCTURE;

EID: 34547881915     PISSN: 09467076     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00542-007-0400-7     Document Type: Article

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