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Volumn 8, Issue 1, 1998, Pages 29-32

A lateral symmetrically bistable buckled beam

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; BUCKLING; MICROMACHINING; POLISHING; REACTIVE ION ETCHING; SCANNING ELECTRON MICROSCOPY; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS; THERMOOXIDATION;

EID: 0032024150     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/8/1/005     Document Type: Article
Times cited : (82)

References (11)
  • 1
    • 0031095436 scopus 로고    scopus 로고
    • Bulk silicon holding structures for mounting of optical fibres in v-grooves
    • Strandman C and Bäcklund Y 1997 Bulk silicon holding structures for mounting of optical fibres in v-grooves J. Microelectromech. Syst. 6 35-40
    • (1997) J. Microelectromech. Syst. , vol.6 , pp. 35-40
    • Strandman, C.1    Bäcklund, Y.2
  • 2
    • 0032022213 scopus 로고    scopus 로고
    • Passive and fixed alignment of devices using flexible silicon elements formed by selective etching
    • Strandman C and Bäcklund Y 1997 Passive and fixed alignment of devices using flexible silicon elements formed by selective etching J. Micromech. Eng. 8 39-44
    • (1997) J. Micromech. Eng. , vol.8 , pp. 39-44
    • Strandman, C.1    Bäcklund, Y.2
  • 3
    • 0025600732 scopus 로고
    • On a nonvolatile memory cell based on micro-electro-mechanics
    • Hälg B 1990 On a nonvolatile memory cell based on micro-electro-mechanics Proc. 1990 IEEE Workshop on MEMS pp 172-6
    • (1990) Proc. 1990 IEEE Workshop on MEMS , pp. 172-176
    • Hälg, B.1
  • 4
    • 0029232338 scopus 로고
    • Dynamics of a bistable snapping microactuator
    • Yang Y-J and Kim C-J 1995 Dynamics of a bistable snapping microactuator Proc. SPIE 2443 754-62
    • (1995) Proc. SPIE , vol.2443 , pp. 754-762
    • Yang, Y.-J.1    Kim, C.-J.2
  • 5
    • 0000865065 scopus 로고    scopus 로고
    • Snapping microswitches with adjustable acceleration threshold
    • Go J S, Cho Y-H, Kwak B M and Park K 1996 Snapping microswitches with adjustable acceleration threshold Sensors Actuators A 54 579-83
    • (1996) Sensors Actuators A , vol.54 , pp. 579-583
    • Go, J.S.1    Cho, Y.-H.2    Kwak, B.M.3    Park, K.4
  • 6
    • 0015599891 scopus 로고
    • X-ray diffraction topographs of silicon crystals with superposed oxide film: II. Pendellösung fringes: Comparison of experiment with theory
    • Patel J R and Kato N 1973 X-ray diffraction topographs of silicon crystals with superposed oxide film: II. Pendellösung fringes: comparison of experiment with theory J. Appl. Phys. 44 971-7
    • (1973) J. Appl. Phys. , vol.44 , pp. 971-977
    • Patel, J.R.1    Kato, N.2
  • 9
    • 21844505164 scopus 로고
    • Characteristics of quasi buckling
    • Söderkvist J and Lindberg U 1994 Characteristics of quasi buckling Sensors Mater. 6 293-309
    • (1994) Sensors Mater. , vol.6 , pp. 293-309
    • Söderkvist, J.1    Lindberg, U.2
  • 11
    • 0029325460 scopus 로고
    • Black silicon method: A universal method for determining the parameter setting of a fluorine-based reactive ion etched in deep trench etching with profile control
    • Jansen H, de Boer M, Legtenberg R and Elwenspoek M 1995 Black silicon method: a universal method for determining the parameter setting of a fluorine-based reactive ion etched in deep trench etching with profile control J. Micromech. Microeng. 5 115-20
    • (1995) J. Micromech. Microeng. , vol.5 , pp. 115-120
    • Jansen, H.1    De Boer, M.2    Legtenberg, R.3    Elwenspoek, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.