-
3
-
-
19944410470
-
-
B. De Salvo, C. Gerardi, R. van Schaijk, S. A. Lombardo, D. Corso, C. Plantamura, S. Serafino, G. Ammendola, M. van Duuren, P. Goarin, W. Y. Mei, K. van der Jeugd, T. Baron, M. Gély, P. Mur, and S. Deleonibus: IEEE Trans. Device Mater. Reliab. 4 (2004) 377.
-
(2004)
IEEE Trans. Device Mater. Reliab
, vol.4
, pp. 377
-
-
De Salvo, B.1
Gerardi, C.2
van Schaijk, R.3
Lombardo, S.A.4
Corso, D.5
Plantamura, C.6
Serafino, S.7
Ammendola, G.8
van Duuren, M.9
Goarin, P.10
Mei, W.Y.11
van der Jeugd, K.12
Baron, T.13
Gély, M.14
Mur, P.15
Deleonibus, S.16
-
6
-
-
0012784950
-
-
W. Zhu, T. P. Ma, T. Tamagawa, Y. Di, J. Kim, R. Carruthers, M. Gibson, and T. Furukawa: IEDM Tech. Dig., 2001, p. 463.
-
(2001)
IEDM Tech. Dig
, pp. 463
-
-
Zhu, W.1
Ma, T.P.2
Tamagawa, T.3
Di, Y.4
Kim, J.5
Carruthers, R.6
Gibson, M.7
Furukawa, T.8
-
7
-
-
0035718371
-
-
Y. Kim, G. Gebara, M. Freiler, J. Barneet, D. Riely. J. Chen, K. Torres, J. Lim, B. Foran, F. Shappur, A. Agarwal, P. Lysaght, G. A. Brown, C. Young, S. Borthakur, H.-J. Li, B. Nguyen, P. Zeitzoff, G. Bersuker, D. Derro, R. Bergmann, R. W. Murto, A. Hou, H. R. Huff, E. Shero, C. Pomarede, M. Givens, M. Mazanec, and C. Werkhoven: IEDM Tech. Dig., 2001, p. 455.
-
(2001)
IEDM Tech. Dig
, pp. 455
-
-
Kim, Y.1
Gebara, G.2
Freiler, M.3
Barneet, J.4
Riely, D.5
Chen, J.6
Torres, K.7
Lim, J.8
Foran, B.9
Shappur, F.10
Agarwal, A.11
Lysaght, P.12
Brown, G.A.13
Young, C.14
Borthakur, S.15
Li, H.-J.16
Nguyen, B.17
Zeitzoff, P.18
Bersuker, G.19
Derro, D.20
Bergmann, R.21
Murto, R.W.22
Hou, A.23
Huff, H.R.24
Shero, E.25
Pomarede, C.26
Givens, M.27
Mazanec, M.28
Werkhoven, C.29
more..
-
9
-
-
0036714604
-
-
Z. Liu, C. Lee, V. Narayanan, G. Pei, and E. C. Kan: IEEE Trans. Electron Devices 49 (2002) 1606.
-
(2002)
IEEE Trans. Electron Devices
, vol.49
, pp. 1606
-
-
Liu, Z.1
Lee, C.2
Narayanan, V.3
Pei, G.4
Kan, E.C.5
-
10
-
-
0029516376
-
-
S. Tiwari, F. Rana, K. Chan, H. Hanafi, W. Chan, and D. Buchanan: IEDM Tech. Dig., 1995, p. 521.
-
(1995)
IEDM Tech. Dig
, pp. 521
-
-
Tiwari, S.1
Rana, F.2
Chan, K.3
Hanafi, H.4
Chan, W.5
Buchanan, D.6
-
13
-
-
0036477562
-
-
W. J. Zhu, T.-P. Ma, T. Tamagawa, J. Kim, and Y. Di: IEEE Electron Device Lett. 23 (2002) 97.
-
(2002)
IEEE Electron Device Lett
, vol.23
, pp. 97
-
-
Zhu, W.J.1
Ma, T.-P.2
Tamagawa, T.3
Kim, J.4
Di, Y.5
-
14
-
-
17644429462
-
-
R. Muralidhar, R. F. Steimle, M. Sadd, R. Rao, C. T. Swift, E. J. Prinz, J. Yater, L. Grieve, K. Harber, B. Hradsky, S. Straub, B. Acred, W. Paulson, W. Chen, L. Parker, S. G. H. Anderson, M. Rossow, T. Merchant, M. Paransky, T. Huynh, D. Hadad, K.-M. Chang, and B. E. White, Jr.: IEDM Tech. Dig., 2003, p. 601.
-
R. Muralidhar, R. F. Steimle, M. Sadd, R. Rao, C. T. Swift, E. J. Prinz, J. Yater, L. Grieve, K. Harber, B. Hradsky, S. Straub, B. Acred, W. Paulson, W. Chen, L. Parker, S. G. H. Anderson, M. Rossow, T. Merchant, M. Paransky, T. Huynh, D. Hadad, K.-M. Chang, and B. E. White, Jr.: IEDM Tech. Dig., 2003, p. 601.
-
-
-
-
17
-
-
0035714879
-
-
W. J. Tsai, N. K. Zous, C. J. Liu, C. H. Chen, T. Wang, S. Pan, and C. Y. Lu: IEDM Tech. Dig., 2001, p. 719.
-
(2001)
IEDM Tech. Dig
, pp. 719
-
-
Tsai, W.J.1
Zous, N.K.2
Liu, C.J.3
Chen, C.H.4
Wang, T.5
Pan, S.6
Lu, C.Y.7
-
18
-
-
0036923647
-
-
C. T. Swift, G. L. Chindalore, K. Harber, T. S. Harp, A. Hoefler, C. M. Hong, P. A. Ingersoll, C. B. Li, E. J. Prinz, and J. A. Yater: IEDM Tech. Dig., 2002, p. 927.
-
(2002)
IEDM Tech. Dig
, pp. 927
-
-
Swift, C.T.1
Chindalore, G.L.2
Harber, K.3
Harp, T.S.4
Hoefler, A.5
Hong, C.M.6
Ingersoll, P.A.7
Li, C.B.8
Prinz, E.J.9
Yater, J.A.10
-
19
-
-
1642317838
-
-
W.-J. Tsai, C.-C. Yeh, N.-K. Zous, C.-C. Liu, S.-K. Cho, T. Wang, S. C. Pan, and C.-Y. Lu: IEEE Trans. Electron Devices 51 (2004) 434.
-
(2004)
IEEE Trans. Electron Devices
, vol.51
, pp. 434
-
-
Tsai, W.-J.1
Yeh, C.-C.2
Zous, N.-K.3
Liu, C.-C.4
Cho, S.-K.5
Wang, T.6
Pan, S.C.7
Lu, C.-Y.8
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