메뉴 건너뛰기




Volumn 46, Issue 6 A, 2007, Pages 3291-3295

Nonvolatile flash memory devices using CeO2 nanocrystal trapping layer for two-bit per cell applications

Author keywords

Cerium oxide; Flash memory; Nanocrystal; Retention; Trapping layer

Indexed keywords

CERIUM COMPOUNDS; CHARGED PARTICLES; ELECTRIC CHARGE; NANOCRYSTALS; NONVOLATILE STORAGE;

EID: 34547842160     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.3291     Document Type: Article
Times cited : (15)

References (19)
  • 14
    • 17644429462 scopus 로고    scopus 로고
    • R. Muralidhar, R. F. Steimle, M. Sadd, R. Rao, C. T. Swift, E. J. Prinz, J. Yater, L. Grieve, K. Harber, B. Hradsky, S. Straub, B. Acred, W. Paulson, W. Chen, L. Parker, S. G. H. Anderson, M. Rossow, T. Merchant, M. Paransky, T. Huynh, D. Hadad, K.-M. Chang, and B. E. White, Jr.: IEDM Tech. Dig., 2003, p. 601.
    • R. Muralidhar, R. F. Steimle, M. Sadd, R. Rao, C. T. Swift, E. J. Prinz, J. Yater, L. Grieve, K. Harber, B. Hradsky, S. Straub, B. Acred, W. Paulson, W. Chen, L. Parker, S. G. H. Anderson, M. Rossow, T. Merchant, M. Paransky, T. Huynh, D. Hadad, K.-M. Chang, and B. E. White, Jr.: IEDM Tech. Dig., 2003, p. 601.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.