Preferential orientation of a chiral semiconducting carbon nanotube on the locally depassivated Si(100)-2 × 1:H surface identified by scanning tunneling microscopy

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Volumn 3, Issue 8, 2007, Pages 1402-1406

  Albrecht, Peter M ^a   Barraza Lopez, Salvador ^a   Lyding, Joseph W ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Carbon nanotubes; Molecular wires; Nanolithography; Scanning tunneling microscopy; Silicon

Indexed keywords

COVALENT BONDS; MOLECULAR STRUCTURE; NANOLITHOGRAPHY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON;

ATOMICALLY RESOLVED IMAGING; CHIRAL SEMICONDUCTING CARBON NANOTUBES; MOLECULAR WIRES; NANOSCALE DEPASSIVATION;

CARBON NANOTUBES;

LITHOGRAPHY;

NANOTUBE; SILICON;

ANISOTROPY; ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ISOMERISM; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; SURFACE PROPERTY; ULTRASTRUCTURE;

ANISOTROPY; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ISOMERISM; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, SCANNING TUNNELING; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES; PARTICLE SIZE; SEMICONDUCTORS; SILICON; SURFACE PROPERTIES;

EID: 34547842094     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200700070     Document Type: Article

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