SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 84, Issue 21, 2004, Pages 4280-4282

Scanning tunneling spectroscopy of suspended single-wall carbon nanotubes

(4) LeRoy, B J a Lemay, S G a Kong, J a Dekker, C a

a DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; CATALYSTS; CHEMICAL VAPOR DEPOSITION; COMPUTER SIMULATION; COULOMB BLOCKADE; ETCHING; EVAPORATION; IMAGE PROCESSING; PLATINUM; SCANNING TUNNELING MICROSCOPY; SILICA; THICK FILMS; ULTRAHIGH VACUUM;

COULOMB STAIRCASE; SINGLE-WALL CARBON NANOTUBES (SWCNT); TOPOGRAPHY; TUNNEL BARRIERS;

CARBON NANOTUBES;

EID: 2942635773 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1748836 Document Type: Article

Times cited : (46)

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