Lateral manipulation of single-walled carbon nanotubes on H-passivated Si(100) surfaces with an ultrahigh-vacuum scanning tunneling microscope

Small

Volumn 3, Issue 1, 2007, Pages 146-152

  Albrecht, Peter M ^a   Lyding, Joseph W ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Carbon nanotubes; Molecular wires; Nanomanipulation; Scanning tunneling microscopy; Silicon

Indexed keywords

CRYSTAL ORIENTATION; PASSIVATION; SCANNING TUNNELING MICROSCOPY;

MOLECULAR WIRES; NANOMANIPULATION; SEMICONDUCTING SURFACES; SINGLE-WALLED CARBON NANOTUBES (SWNT);

CARBON NANOTUBES;

CARBON NANOTUBE; HYDROGEN; SILICON;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; HEAT; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; MICROMANIPULATION; NANOTECHNOLOGY; PARTICLE SIZE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE; VACUUM;

CRYSTALLIZATION; HEAT; HYDROGEN; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROMANIPULATION; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES, CARBON; PARTICLE SIZE; SILICON; SURFACE PROPERTIES; VACUUM;

EID: 33846319776     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200600326     Document Type: Article

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