A comparison of dynamic atomic force microscope set-ups for performing atomic scale manipulation experiments

Nanotechnology

Volumn 18, Issue 34, 2007, Pages

  Trevethan, T ^a   Watkins, M ^a   Shluger, A L ^a   Polesel Maris, J ^b   Gauthier, S ^c   Kantorovich, L N ^d  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b CSEM   (Switzerland)

^c CEMES CNRS   (France)

^d KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

QUARTZ; SILICON; VIRTUAL REALITY;

ATOMISTIC MODEL; QUARTZ TUNING FORK; SINGLE ATOM MANIPULATION; TIP TRAJECTORY;

ATOMIC FORCE MICROSCOPY;

MAGNESIUM OXIDE; OXYGEN; SILICON DIOXIDE;

AMPLITUDE MODULATION; ARTICLE; ATOMIC FORCE MICROSCOPY; CALCULATION; DYNAMICS; EXPERIMENTAL STUDY; INSTRUMENTATION; MICROMANIPULATOR; NOISE; PRIORITY JOURNAL; SIMULATION; SURFACE PROPERTY; TEMPERATURE;

EID: 34547729205     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/34/345503     Document Type: Article

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