Noise in frequency modulation-dynamic force microscopy

Journal of Physics: Conference Series

Volumn 61, Issue 1, 2007, Pages 949-954

  Polesel Maris, Jérǒme ^a   Gauthier, Sébastien ^b  

^a CSEM   (Switzerland)

^b CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247471246     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/61/1/188     Document Type: Article

References (10)

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