Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 × 1)

Solid State Communications

Volumn 124, Issue 12, 2002, Pages 469-472

  Ozgur Ozer H ^a   Atabak, Mehrdad ^a   Oral, Ahmet ^a  

^a BILKENT UNIVERSITY   (Turkey)

Author keywords

A. Si (100) surface; E. nc AFM STM studies

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; DIMERS; OSCILLATIONS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; SURFACE TOPOGRAPHY; TUNGSTEN;

DISSIPATION SPECTROSCOPY;

SEMICONDUCTING SILICON;

EID: 0036895431     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(02)00547-1     Document Type: Conference Paper

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