Mechanical atom manipulation with small amplitude dynamic force microscopy

Applied Physics Letters

Volumn 89, Issue 2, 2006, Pages

  Kawai, Shigeki ^a   Kawakatsu, Hideki ^b  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MANIPULATORS; MODIFICATION; SENSITIVITY ANALYSIS; STABILITY; THERMAL EFFECTS;

DYNAMIC FORCE MICROSCOPY; INTERACTION FORCE; SURFACE IMAGING;

ATOMS;

EID: 33746102177     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2220539     Document Type: Article

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