Photocurrent imaging of charge transport barriers in carbon nanotube devices

Nano Letters

Volumn 5, Issue 3, 2005, Pages 507-510

  Balasubramanian, Kannan ^a   Burghard, Marko ^a   Kern, Klaus ^a   Scolari, Matteo ^b   Mews, Alf ^b  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; ELECTRIC CONDUCTANCE; ELECTRODES; ELECTRON TRANSITIONS; ELECTRONIC STRUCTURE; IMAGING TECHNIQUES; OPTICAL MICROSCOPY; PHOTOCURRENTS;

MAGNIFICATION; PHOTOELECTRONIC TRANSPORT (PET); SINGLE-WALLED CARBON NANOTUBES (SWCNT); STRUCTURAL DEFECTS;

CHARGE TRANSFER;

CARBON NANOTUBE;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; ELECTRON TRANSPORT; ELECTRONICS; EQUIPMENT; EVALUATION; IMPEDANCE; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PHOTOCHEMISTRY; POLARIZATION MICROSCOPY; ULTRASTRUCTURE;

ELECTRIC IMPEDANCE; ELECTROCHEMISTRY; ELECTRON TRANSPORT; ELECTRONICS; EQUIPMENT FAILURE ANALYSIS; MATERIALS TESTING; MICROSCOPY, POLARIZATION; NANOTECHNOLOGY; NANOTUBES, CARBON; PHOTOCHEMISTRY;

EID: 16244369081     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl050053k     Document Type: Article

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