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Volumn 48, Issue , 2005, Pages
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Ultra-dynamic voltage scaling using sub-threshold operation and local voltage dithering in 90nm CMOS
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Author keywords
[No Author keywords available]
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Indexed keywords
ENERGY POINT;
TEST CHIPS;
VOLTAGE DITHERING;
VOLTAGE SCALING;
ELECTRIC POTENTIAL;
ENERGY MANAGEMENT;
MICROPROCESSOR CHIPS;
THERMAL EFFECTS;
CMOS INTEGRATED CIRCUITS;
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EID: 28144440165
PISSN: 01936530
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (34)
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References (4)
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