-
1
-
-
23744497167
-
Thermal conductivity in advanced chips
-
Feb
-
G. Becker, C. Lee, and Z. Lin, "Thermal conductivity in advanced chips," IEEE Trans. Adv. Packag., vol. 14, no. 7, pp. 14-16, Feb. 2005.
-
(2005)
IEEE Trans. Adv. Packag
, vol.14
, Issue.7
, pp. 14-16
-
-
Becker, G.1
Lee, C.2
Lin, Z.3
-
2
-
-
25844448629
-
Mixing, rheology, and stability of highly filled thermal pastes
-
C. Feger, J. D. Gelorme, M. McGlashan-Powell, and D. M. Kalyon, "Mixing, rheology, and stability of highly filled thermal pastes," IBM J. Res. Develop., vol. 41, no. 4/5, pp. 699-707, 2005.
-
(2005)
IBM J. Res. Develop
, vol.41
, Issue.4-5
, pp. 699-707
-
-
Feger, C.1
Gelorme, J.D.2
McGlashan-Powell, M.3
Kalyon, D.M.4
-
3
-
-
1242305940
-
Using cap-integral standoffs to reduce chip hot-spot temperatures in electronic packages
-
M. S. June and K. K. Sikka, "Using cap-integral standoffs to reduce chip hot-spot temperatures in electronic packages," in Proc. IEEE Inter Soc. Conf. Thermal Phenom., 2002, pp. 173-178.
-
(2002)
Proc. IEEE Inter Soc. Conf. Thermal Phenom
, pp. 173-178
-
-
June, M.S.1
Sikka, K.K.2
-
4
-
-
28144442389
-
Gap-reduced thermal paste package design for cooling single flip-chip electronic modules
-
K. K. Sikka, H. T. Toy, D. L. Edwards, S. Iruvanti, E. M. Ingalls, and P. W. DeHaven, "Gap-reduced thermal paste package design for cooling single flip-chip electronic modules," in Proc. IEEE Inter Soc. Conf. Thermal Phenom., 2002, pp. 651-657.
-
(2002)
Proc. IEEE Inter Soc. Conf. Thermal Phenom
, pp. 651-657
-
-
Sikka, K.K.1
Toy, H.T.2
Edwards, D.L.3
Iruvanti, S.4
Ingalls, E.M.5
DeHaven, P.W.6
-
5
-
-
0346024327
-
Thermal resistance of particle laden polymeric thermal interface materials
-
R. S. Prasher, J. Shipley, S. Prstic, P. Koning, and J. L. Wang, "Thermal resistance of particle laden polymeric thermal interface materials," J. Heat Transf., vol. 125, pp. 1170-1177, 2003.
-
(2003)
J. Heat Transf
, vol.125
, pp. 1170-1177
-
-
Prasher, R.S.1
Shipley, J.2
Prstic, S.3
Koning, P.4
Wang, J.L.5
-
6
-
-
0026151747
-
Stable, highly concentrated suspensions for electronic and ceramic materials applications
-
May
-
I. Sushumna, R. K. Gupta, and E. Ruckenstein, "Stable, highly concentrated suspensions for electronic and ceramic materials applications," J. Mater. Res., vol. 6, no. 5, pp. 1082-1092, May 1991.
-
(1991)
J. Mater. Res
, vol.6
, Issue.5
, pp. 1082-1092
-
-
Sushumna, I.1
Gupta, R.K.2
Ruckenstein, E.3
-
7
-
-
0033694254
-
Percolation theory applied to the analysis of thermal interface materials in flip-chip technology
-
A. Devpura, P. Phelan, and R. Prasher, "Percolation theory applied to the analysis of thermal interface materials in flip-chip technology," in Proc. IEEE Inter Soc. Conf. Thermal Phenom., 2000, pp. 21-28.
-
(2000)
Proc. IEEE Inter Soc. Conf. Thermal Phenom
, pp. 21-28
-
-
Devpura, A.1
Phelan, P.2
Prasher, R.3
-
8
-
-
0035474977
-
Surface chemistry and characteristics based model for the thermal contact resistance of fluidic interstitial thermal interface materials
-
R. S. Prasher, "Surface chemistry and characteristics based model for the thermal contact resistance of fluidic interstitial thermal interface materials," J. Heat Transf., vol. 123, pp. 969-975, 2001.
-
(2001)
J. Heat Transf
, vol.123
, pp. 969-975
-
-
Prasher, R.S.1
-
9
-
-
0141953082
-
Dependence of thermal conductivity and mechanical rigidity of particle-laden polymeric thermal interface material on particle volume fraction
-
R. S. Prasher, P. Koning, J. Shipley, and A. Devpura, "Dependence of thermal conductivity and mechanical rigidity of particle-laden polymeric thermal interface material on particle volume fraction," J. Electron. Packag., vol. 125, pp. 386-391, 2003.
-
(2003)
J. Electron. Packag
, vol.125
, pp. 386-391
-
-
Prasher, R.S.1
Koning, P.2
Shipley, J.3
Devpura, A.4
-
10
-
-
3242778561
-
Optimization of thermal interface materials for electronics cooling applications
-
June
-
V. Singhal, T. Siegmund, and S. V. Garimella, "Optimization of thermal interface materials for electronics cooling applications," IEEE Trans. Comp. Packag. Technol., vol. 27, no. 2, pp. 244-252, June 2004.
-
(2004)
IEEE Trans. Comp. Packag. Technol
, vol.27
, Issue.2
, pp. 244-252
-
-
Singhal, V.1
Siegmund, T.2
Garimella, S.V.3
-
11
-
-
0035340114
-
Pattern formation in non-Newtonian Hele-Shaw flow
-
P. Fast, L. Kondic, M. J. Shelley, and P. Palffz-Muhoray, "Pattern formation in non-Newtonian Hele-Shaw flow," Phys. Fluids, vol. 13, no. 5, pp. 1191-1212, 2001.
-
(2001)
Phys. Fluids
, vol.13
, Issue.5
, pp. 1191-1212
-
-
Fast, P.1
Kondic, L.2
Shelley, M.J.3
Palffz-Muhoray, P.4
-
12
-
-
0000804616
-
Hele-Shaw flow and pattern formation in a time-dependent gap
-
M. J. Shelley, F.-R. Tian, and K. Wlodarski, "Hele-Shaw flow and pattern formation in a time-dependent gap," Nonlinearity, vol. 10, pp. 1471-1495, 1997.
-
(1997)
Nonlinearity
, vol.10
, pp. 1471-1495
-
-
Shelley, M.J.1
Tian, F.-R.2
Wlodarski, K.3
-
15
-
-
28144452256
-
-
5th ed. Berlin, Germany: Springer
-
J. H. Spurk, Ströhmungslehre, 5th ed. Berlin, Germany: Springer, 1996.
-
(1996)
Ströhmungslehre
-
-
Spurk, J.H.1
-
16
-
-
84950156702
-
Design, assembly, and communissioning of a test apparatus for characterizing thermal interface materials
-
J. R. Culham, P. Teerstra, I. Savija, and M. M. Yovanovich, "Design, assembly, and communissioning of a test apparatus for characterizing thermal interface materials," in Proc. IEEE Inter Soc. Conf. Thermal Phenom., 2002, pp. 128-135.
-
(2002)
Proc. IEEE Inter Soc. Conf. Thermal Phenom
, pp. 128-135
-
-
Culham, J.R.1
Teerstra, P.2
Savija, I.3
Yovanovich, M.M.4
-
17
-
-
0037372953
-
Performance and testing of thermal interface materials
-
J. P. Gwinn and R. L. Webb, "Performance and testing of thermal interface materials," Microelectron. J., vol. 34, pp. 215-222, 2003.
-
(2003)
Microelectron. J
, vol.34
, pp. 215-222
-
-
Gwinn, J.P.1
Webb, R.L.2
-
18
-
-
84950107970
-
Measuring interface thermal resistance values by transient testing
-
M. Rencz, V. Szekely, G. Farkas, and B. Courtois, "Measuring interface thermal resistance values by transient testing," in Proc. IEEE Inter Soc. Conf. Thermal Phenom., 2002, pp. 136-141.
-
(2002)
Proc. IEEE Inter Soc. Conf. Thermal Phenom
, pp. 136-141
-
-
Rencz, M.1
Szekely, V.2
Farkas, G.3
Courtois, B.4
-
19
-
-
0037272259
-
The urgent need for widely accepted test methods for thermal interface materials
-
C. J. M. Lasance, "The urgent need for widely accepted test methods for thermal interface materials," in Proc. IEEE SEMI-THERM Symp., 2003, pp. 123-128.
-
(2003)
Proc. IEEE SEMI-THERM Symp
, pp. 123-128
-
-
Lasance, C.J.M.1
-
20
-
-
2342617400
-
A procedure to correct the error in the structure function based thermal measuring methods
-
M. Rencz et al., "A procedure to correct the error in the structure function based thermal measuring methods," in Proc. IEEE 20th SEMITHERM Symp., 2002, pp. 92-97.
-
(2002)
Proc. IEEE 20th SEMITHERM Symp
, pp. 92-97
-
-
Rencz, M.1
|