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Volumn 2002-January, Issue , 2002, Pages 136-141

Measuring interface thermal resistance values by transient testing

Author keywords

Area measurement; Capacitance measurement; Conductivity measurement; Density measurement; Electrical resistance measurement; Resistance heating; Testing; Thermal conductivity; Thermal resistance; Time measurement

Indexed keywords

CAPACITANCE MEASUREMENT; DENSITY MEASUREMENT (SPECIFIC GRAVITY); HEAT CONDUCTION; HEAT RESISTANCE; TESTING; THERMAL CONDUCTIVITY; TIME MEASUREMENT;

EID: 84950107970     PISSN: 19363958     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ITHERM.2002.1012449     Document Type: Conference Paper
Times cited : (6)

References (11)
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  • 2
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    • (2000) th IEEE SEMITHERM Symposium , pp. 167-173
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  • 3
    • 0041163510 scopus 로고    scopus 로고
    • A New Evaluation Method of Thermal Transient Measurement Results
    • V. Székely: "A New Evaluation Method of Thermal Transient Measurement Results", Microelectronics Journal, Vol. 28, No. 3, pp. 277-292, 1997
    • (1997) Microelectronics Journal , vol.28 , Issue.3 , pp. 277-292
    • Székely, V.1
  • 5
    • 0026191015 scopus 로고
    • On the representation of infinite-length distributed RC one-ports
    • V. Székely, "On the representation of infinite-length distributed RC one-ports", IEEE Trans. on Circuits and Systems, Vol.38. pp. 711-719, 1991.
    • (1991) IEEE Trans. on Circuits and Systems , vol.38 , pp. 711-719
    • Székely, V.1
  • 8
    • 0024069775 scopus 로고
    • Fine structure of heat flow path in semiconductor devices: A measurement and identification method
    • V. Székely and Tran Van Bien: "Fine structure of heat flow path in semiconductor devices: a measurement and identification method", Solid-State Electronics, V.31, pp. 1363-1368 (1988)
    • (1988) Solid-State Electronics , vol.31 , pp. 1363-1368
    • Székely, V.1    Van Bien, T.2
  • 9
    • 84950157461 scopus 로고    scopus 로고
    • http://www.micred.com/t3ster.html
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    • 0003110305 scopus 로고    scopus 로고
    • Determining Partial Thermal Resistances in a Heat-Flow Path with the Help of Transient Measurements
    • Paris, France, 24-27 September
    • th THERMINIC Workshop, Paris, France, 24-27 September 2001, pp 250-255
    • (2001) th THERMINIC Workshop , pp. 250-255
    • Rencz, M.1    Székely, V.2
  • 11
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.