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Volumn 2002-January, Issue , 2002, Pages 651-657

Gap-reduced thermal paste package design for cooling single flip-chip electronic modules

Author keywords

Assembly; Conducting materials; Electronic packaging thermal management; Electronics cooling; Inorganic materials; Sealing materials; Seals; Thermal conductivity; Thermal loading; Thermal resistance

Indexed keywords

ASSEMBLY; CHIP SCALE PACKAGES; COOLING; DESIGN; ELECTRONICS PACKAGING; FLIP CHIP DEVICES; HEAT RESISTANCE; SEALANTS; SEALING (CLOSING); SEALS; STRUCTURAL DESIGN; THERMAL CONDUCTIVITY;

EID: 28144442389     PISSN: 19363958     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ITHERM.2002.1012516     Document Type: Conference Paper
Times cited : (5)

References (5)
  • 5
    • 0033709085 scopus 로고    scopus 로고
    • Advanced Thermal Tester for Accurate Measurement of the Internal Thermal Resistance of High Power Electronic Modules
    • Las Vegas, NV, Accepted for publication in the IEEE Transactions on Components, Manufacturing and Packaging Technology
    • "Advanced Thermal Tester for Accurate Measurement of the Internal Thermal Resistance of High Power Electronic Modules," K. K. Sikka, Intersociety Conference on Thermal Phenomena in Electronic Systems, ITHERM 2000, Las Vegas, NV, Vol. II, 208-212. Accepted for publication in the IEEE Transactions on Components, Manufacturing and Packaging Technology.
    • Intersociety Conference on Thermal Phenomena in Electronic Systems, ITHERM 2000 , vol.2 , pp. 208-212
    • Sikka, K.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.