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Zhou, D. J., Sinniah, K., Abell, C. & Rayment, T. 2002 Use of atomic force microscopy for making addresses in DNA coatings. Langmuir 18, 8278-8281. (doi:10.1021/la0258547)
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(2002)
Langmuir
, vol.18
, pp. 8278-8281
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Zhou, D.J.1
Sinniah, K.2
Abell, C.3
Rayment, T.4
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