A TCAD approach to robust ESD design in oxide-confined VCSELs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6484, Issue , 2007, Pages

  Meier, Hektor ^a   Santschi, Rafael ^a   Odermatt, Stefan ^a   Witzigmann, Bernd ^a   Eitel, Sven ^b   Nallet, Franck ^c   Letay, Gergö ^c  

^a ETH ZURICH   (Switzerland)

^b Bookham Switzerland AG   (Switzerland)

^c SYNOPSYS SWITZERLAND LLC   (Switzerland)

Author keywords

Electrostatic discharge (ESD); Hydrodynarnic simulation; Robustness; Technology computer aided design (TCAD); VCSEL

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; CURRENT DENSITY; ELECTROSTATIC DISCHARGE; INTERFACES (COMPUTER); MATHEMATICAL MODELS;

HYDRODYNARNIC SIMULATION; MICROSCOPIC SIMULATION; SIMULATION TOOLS; TECHNOLOGY COMPUTER AIDED DESIGN (TCAD);

SURFACE EMITTING LASERS;

EID: 34248662684     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.698997     Document Type: Conference Paper

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