A TCAD based yield and reliability analysis for VCSELs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6132, Issue , 2006, Pages

  Odermatt, Stefan ^a   Eitel, Sven ^b   Hövel, Rainer ^b   Letay, Gergö ^c   Witzigmann, Bernd ^a  

^a ETH ZURICH   (Switzerland)

^b Bookham Inc   (Switzerland)

^c SYNOPSYS SWITZERLAND LLC   (Switzerland)

Author keywords

Design for manufacturing (DFM); Technology computer aided design (TCAD); VCSEL; Yield analysis

Indexed keywords

COMPUTER SIMULATION; OPTICAL SYSTEMS; OPTICALLY PUMPED LASERS; RELIABILITY; ROBUSTNESS (CONTROL SYSTEMS); STATISTICAL METHODS;

DESIGN FOR MANUFACTURING (DFM); TECHNOLOGY COMPUTER AIDED DESIGN (TCAD); VCSEL; YIELD ANALYSIS;

COMPUTER AIDED DESIGN;

EID: 33646182023     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.641412     Document Type: Conference Paper

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