Characterization of Failure Mechanisms for Oxide VCSELs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4994, Issue , 2003, Pages 55-66

  McHugo, S A ^a   Krishnan, A ^a   Krueger, J ^a   Luo, Y ^a   Tan, N X ^a   Osentowski, T ^a   Xie, S ^a   Mayonte, M ^a   Herrick, B ^a   Deng, Q ^a   Heidecker, M ^a   Eastley, D ^a   Keever, M ^a   Kocot, C ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

Characterization; Oxide; Reliability; VCSEL

Indexed keywords

CONTAMINATION; FAILURE ANALYSIS; LASER BEAMS; OPTICAL COMMUNICATION; PROBABILITY; SEMICONDUCTING GALLIUM ARSENIDE; THERMAL EFFECTS;

WAFER-LEVEL TESTING;

SEMICONDUCTOR LASERS;

EID: 0141567976     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.482637     Document Type: Conference Paper

References (5)

1. Generic Reliability Assurance Requirements for Optoelectronic Devices used in Telecommunications Equipment, Bellcore, GR-468-CORE, 1998
2. S. Xie, G. De Brabander, W. Widjaja, U. Koelle, A.-N. Chen, L. Giovane, F. Hu, B. Herrick, M. Keever and T. Osentowski, "Reliability of Oxide VCSELs in Non-Hermetic Environments", presented at the 15th Annual Meeting of IEEE Laser and Electro-Optics Society (LEOS 2002), published by IEEE
3. J. Krueger, R. Sabharwahl, S. A. McHugo, N. Tan, N. Janda, M.S. Mayonte, M. Heidecker, D. Eastley, M.R. Keever and C.P. Kocot, "Studies of ESD-related failure patterns of Agilent oxide VCSELs", presented at the SPIE Photonics West, Conference, San Jose CA USA, Jan 25-31, 2003, Conference 4994, paper 24
4. B.M. Hawkins, R.A. Hawthorne III, J.K. Guenter, J.A. Tatum and J. R. Biard, "Reliability of Various Size Oxide Aperture VCSELs", presented at the Electronic Components and Technologies Conference San Diego CA USA, 2002
5. S. Xie, R.W. Herrick, G.N. De Brabander, W.H. Widjaja, U. Koelle, A. Cheng, L.M. Giovane, F.Z. Hu, M.R. Keever, T. Osentowski, S.A. McHugo, M.S. Mayonte, S.M. Kim, D.R. Chamberlin, S.J. Rosner and G. Girolami, "Reliability and failure mechanisms of oxide VCSELs in non-hermetic environments", presented at the SPIE Photonics West, San Jose, CA, USA, Jan 25-31, 2003, Conference 4994, paper 21