SCOPUS 정보 검색 플랫폼

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 22, Issue 4, 2004, Pages 1970-1973

Effect of electrostatic discharge on power output and reliability of 850 nm vertical-cavity surface-emitting lasers

(6) Huang, Chun Yuan a Wu, Meng Chyi a Yu, Hsin Chieh b Jiang, Wen Jang c Wang, Jin Mei c Sung, Chia Pin c

a NATIONAL TSING HUA UNIVERSITY (Taiwan)

b NATIONAL CHENG KUNG UNIVERSITY (Taiwan)

c INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRIC DISCHARGES; ELECTROSTATICS; LEAKAGE CURRENTS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL DATA PROCESSING; OPTICAL INTERCONNECTS; PHOTODEGRADATION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; THRESHOLD VOLTAGE;

ELECTROSTATIC DISCHARGE (ESD); FAR-FIELD PATTERNS (FFP); VERTICAL-CAVITY SURFACE-EMITTING LASERS (VCSEL);

SEMICONDUCTOR LASERS;

EID: 4944249156 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.1775004 Document Type: Article

Times cited : (1)

References (8)

1
- 0033687159
- H. J. Unold, S. W. Z. Mahmoud, F. Eberhard, R. Jäger, and K. J. Ebeling, Proc. SPIE 3946, 207 (2000).
- (2000) Proc. SPIE , vol.3946 , pp. 207
- Unold, H.J.¹ Mahmoud, S.W.Z.² Eberhard, F.³ Jäger, R.⁴ Ebeling, K.J.⁵

2
- 0343341854
- H. J. Unold, S. W. Z. Mahmoud, R. Jäger, M. Kicherer, M. C. Riedl, and K. J. Ebeling, IEEE Photonics Technol. Lett. 12, 939 (2000).
- (2000) IEEE Photonics Technol. Lett. , vol.12 , pp. 939
- Unold, H.J.¹ Mahmoud, S.W.Z.² Jäger, R.³ Kicherer, M.⁴ Riedl, M.C.⁵ Ebeling, K.J.⁶

3
- 0035263867
- M. Miller, M. Grabherr, R. King, R. Jäger, R. Michalzik, and K. J. Ebeling, IEEE J. Sci. Top. Quantum Electron. 7, 210 (2001).
- (2001) IEEE J. Sci. Top. Quantum Electron. , vol.7 , pp. 210
- Miller, M.¹ Grabherr, M.² King, R.³ Jäger, R.⁴ Michalzik, R.⁵ Ebeling, K.J.⁶

4
- 0004039985
- ESD Association, New York
- N. Y. Rome, ESD Association Standard Test Method for Electrostatic Discharge (ESD) Sensitivity Testing: Human Body Model (HBM) Component Level (ESD Association, New York, 1998).
- (1998) ESD Association Standard Test Method for Electrostatic Discharge (ESD) Sensitivity Testing: Human Body Model (HBM) Component Level
- Rome, N.Y.¹

5
- 0026136427
- F. Magistrali, D. Sala, G. Salmini, F. Fantini, M. Giansante, and M. Vanzi, 29th IEEE International Reliability Physics Symposium, 1991, p. 224.
- (1991) 29th IEEE International Reliability Physics Symposium , pp. 224
- Magistrali, F.¹ Sala, D.² Salmini, G.³ Fantini, F.⁴ Giansante, M.⁵ Vanzi, M.⁶

6
- 0033716340
- J. A. Tatum, A. Clark, J. K. Guenter, R. A. Hawthorne, and R. H. Johnson, Proc. SPIE 3946, 2 (2000).
- (2000) Proc. SPIE , vol.3946 , pp. 2
- Tatum, J.A.¹ Clark, A.² Guenter, J.K.³ Hawthorne, R.A.⁴ Johnson, R.H.⁵

7
- 4944261312
- G. Giaretta, M. Y. Li, G. S. Li, W. Yuen, and C. J. Chang-Hasnain, IEEE Photonics Technol. Lett. 9, 2296 (1997).
- (1997) IEEE Photonics Technol. Lett. , vol.9 , pp. 2296
- Giaretta, G.¹ Li, M.Y.² Li, G.S.³ Yuen, W.⁴ Chang-Hasnain, C.J.⁵

8
- 79955990947
- S. H. Park, Y. Park, H. Kim, H. Jeon, S. M. Hwang, J. K. Lee, S. H. Nam, and B. C. Koh, Appl. Phys. Lett. 80, 183 (2002).
- (2002) Appl. Phys. Lett. , vol.80 , pp. 183
- Park, S.H.¹ Park, Y.² Kim, H.³ Jeon, H.⁴ Hwang, S.M.⁵ Lee, J.K.⁶ Nam, S.H.⁷ Koh, B.C.⁸

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.