Studies of BSD-related failure patterns of agilent oxide VCSELs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4994, Issue , 2003, Pages 162-172

  Krueger, Joachim ^a   Sabharwal, Reena ^a   McHugo, Scott ^a   Nguyen, Kimanh ^a   Tan, Ning Xia ^a   Janda, Naginder ^a   Mayonte, Myrna ^a   Heidecker, Mike ^a   Eastley, David ^a   Keever, Mark ^a   Kocot, Chris ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

Degradation; Electrostatic Discharge (ESD); Failure mechanism; Long term reliability; VCSEL

Indexed keywords

ELECTRIC DISCHARGES; ELECTROLUMINESCENCE; ELECTROSTATIC DEVICES; PHOTODEGRADATION; TRANSMISSION ELECTRON MICROSCOPY;

ELECTROSTATIC DISCHARGES (ESD);

LASERS;

EID: 0141567954     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.482632     Document Type: Conference Paper

References (16)

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