AOC moving forward: The impact of materials behavior

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6132, Issue , 2006, Pages

  Mathes, David ^a   Guenter, Jim ^a   Tatum, Jim ^a   Johnson, Ralph ^a   Hawkins, Bobby ^a   Johnson, Chris ^a   Hawthorne, Bobby ^a  

^a Advanced Optical Components   (United States)

Author keywords

ESD; Failure analysis; III V material degradation; Reliability; VCSEL; Vertical Cavity Surface Emitting Lasers

Indexed keywords

ESD; III-V MATERIAL DEGRADATION; VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

FAILURE ANALYSIS; PRODUCT DESIGN; RELIABILITY; SEMICONDUCTOR LASERS;

MATERIALS SCIENCE;

EID: 33646170480     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.646447     Document Type: Conference Paper

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