Characterization and optimization of a bipolar ESD-device by measurements and simulations

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1998, Pages 290-300

  Stricker, Andreas D ^a   Mettler, Stephan ^a   Wolf, Heinrich ^a   Mergens, Markus ^a   Wilkening, Wolfgang ^a   Gieser, Horst ^a   Fichtner, Wolfgang ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED DEVICE MODELS (CDM);

COMPUTER SCIENCE; ELECTRIC DISCHARGES; ELECTROSTATICS; INTEGRATED CIRCUIT LAYOUT; OPTIMIZATION; SEMICONDUCTOR DEVICE MODELS;

BIPOLAR TRANSISTORS;

EID: 0032312818     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (29)