Smallest (∼10 nm) phase-change marks in amorphous and crystalline Ge2Sb2Te5 films

Journal of Non-Crystalline Solids

Volumn 353, Issue 18-21, 2007, Pages 1899-1903

  Tanaka, Keiji ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Atomic force and scanning tunneling microscopy; Nanoclusters; Nanocrystals; Nucleation

Indexed keywords

AMORPHIZATION; CRYSTALLIZATION; GERMANIUM COMPOUNDS; NANOCLUSTERS; NANOCRYSTALS; NUCLEATION; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

PHASE CHANGE MARKS; TUNNELING CURRENTS;

AMORPHOUS FILMS;

EID: 34247869804     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.02.020     Document Type: Article

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