Study of the local electrical properties of metal surfaces using an AFM with a conducting probe

IEEE Transactions on Components Packaging and Manufacturing Technology Part A

Volumn 21, Issue 1, 1998, Pages 76-81

  Schneegans, Olivier ^a   Houzé, Frédéric ^a   Meyer, René ^a   Boyer, Lionel ^a  

^a UNIV PARIS SUD   (France)

Author keywords

Atomic force microscopy; Conducting probe; Electron transport process; Local electrical properties; Nanocontact

Indexed keywords

ATOMIC FORCE MICROSCOPY; COATINGS; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; NANOTECHNOLOGY; PROBES; SURFACE ROUGHNESS;

CONDUCTING PROBE; NANOCONTACT; NANOMETER SCALE RESOLUTION;

ELECTRIC CONTACTS;

EID: 0032022989     PISSN: 10709886     EISSN: None     Source Type: Journal    
DOI: 10.1109/95.679036     Document Type: Article

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