메뉴 건너뛰기




Volumn 36, Issue 3, 2007, Pages 179-190

Interfacial chemistry of InP/GaAs bonded pairs

Author keywords

Fourier transform infrared spectroscopy (FTIR); Gallium arsenide; Indium phosphide; Wafer bonding

Indexed keywords

GALLIUM ARSENIDE; THERMAL ANNEALING SHIFTS;

EID: 34247641707     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-006-0077-1     Document Type: Article
Times cited : (7)

References (74)
  • 49
    • 34247597770 scopus 로고    scopus 로고
    • 3rd ed, ed. M.R. Brozel and G.E. Stillman London: INSPEC, Institution of Electrical Engineers
    • Properties of Gallium Arsenide, 3rd ed., ed. M.R. Brozel and G.E. Stillman (London: INSPEC, Institution of Electrical Engineers, 1996), pp. 210-206.
    • (1996) Properties of Gallium Arsenide , pp. 210-206
  • 50
    • 0004108176 scopus 로고
    • Properties of Indium Phosphide
    • London: INSPEC, Institution of Electrical Engineers
    • Properties of Indium Phosphide, EMIS Datareviews Series No. 6 (London: INSPEC, Institution of Electrical Engineers, 1991), pp. 137-139.
    • (1991) EMIS Datareviews Series , vol.6 , pp. 137-139
  • 51
    • 34247626281 scopus 로고    scopus 로고
    • ed. Brian Smith Baton Rouge, LA: CRC Press
    • Infrared Spectral Interpretation, ed. Brian Smith (Baton Rouge, LA: CRC Press, 1999), p. 33.
    • (1999) Infrared Spectral Interpretation , pp. 33


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.