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Volumn 76, Issue 6, 1997, Pages 445-452

Structure of the wafer fused InP (001)-GaAs (001)interface

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DEVICE STRUCTURES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031338949     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008397178887     Document Type: Article
Times cited : (13)

References (19)
  • 12
    • 85007874149 scopus 로고    scopus 로고
    • The Materials Society) (to be published
    • Sagalowicz, L., Jouneau, P. H., Rudra, A., Syrbu, V., and Kapon, E., 1997, Boundaries and Interfaces in Materials, TMS Conf. Proc. (The Materials Society) (to be published).
    • (1997) And Kapon, E
    • Sagalowicz, L.1    Jouneau, P.H.2    Rudra, A.3    Syrbu, V.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.