-
2
-
-
84996250478
-
-
Balluffi, R. W., Saas, S. L., and Schober, T., 1972, Phil. Mag., 26, 585.
-
(1972)
Phil. Mag
, vol.26
, pp. 585
-
-
Balluffi, R.W.1
Saas, S.L.2
Schober, T.3
-
3
-
-
85007870971
-
-
Bristol: Institute of Physics
-
Benamara, M., Rocher, A., Laporte, A., Sarrabayrousse, G., Lescouzéres, L., and PeyreLavigne, A., 1995, Microscopy of Semiconducting Materials 1995, Inst. Phys. Conf. Ser., vol. 146 (Bristol: Institute of Physics).
-
(1995)
Microscopy of Semiconducting Materials 1995, Inst. Phys. Conf. Ser
, pp. 146
-
-
Benamara, M.1
Rocher, A.2
Laporte, A.3
Sarrabayrousse, G.4
Lescouzéres, L.5
Peyrelavigne, A.6
-
5
-
-
0003598030
-
-
New York: Krieger
-
Hirsch, P., Howie, A., Nicholson, R. B., Whelan, M. J., and Pashley, D. W., 1965, Electron Microscopy of Thin Crystals (New York: Krieger).
-
(1965)
Electron Microscopy of Thin Crystals
-
-
Hirsch, P.1
Howie, A.2
Nicholson, R.B.3
Whelan, M.J.4
Pashley, D.W.5
-
6
-
-
0028761612
-
-
Kang, J. M., Nouaoura, M., Lassabate're, L., and Rocher, A., 1994, J. Cryst. Growth, 143, 115.
-
(1994)
J. Cryst. Growth
, vol.143
, pp. 115
-
-
Kang, J.M.1
Nouaoura, M.2
Lassabate're, L.3
Rocher, A.4
-
7
-
-
0007038846
-
-
Komninou, P., Stoemenos, G., Dimitrakopoulos, G. P., and Karakostas, T., 1994, J. appl. Phys., 75, 143.
-
(1994)
J. Appl. Phys
, vol.75
, pp. 143
-
-
Komninou, P.1
Stoemenos, G.2
Dimitrakopoulos, G.P.3
Karakostas, T.4
-
8
-
-
21544450368
-
-
Lo, Y. H., Bhat, R., Hwang, D. M., Koza, M. A., and Lee, T. P., 1991, Appl. Phys. Lett., 58, 1961.
-
(1991)
Appl. Phys. Lett
, pp. 58
-
-
Lo, Y.H.1
Bhat, R.2
Hwang, D.M.3
Koza, M.A.4
Lee, T.P.5
-
9
-
-
36449006172
-
-
Okuno, Y., Uomi, K., Aoki, M., Taniwatari, T., Susuki, M., and Kondow, M., 1995, Appl. Phys. Lett., 66, 451.
-
(1995)
Appl. Phys. Lett
, vol.66
, pp. 451
-
-
Okuno, Y.1
Uomi, K.2
Aoki, M.3
Taniwatari, T.4
Susuki, M.5
Kondow, M.6
-
10
-
-
85007846114
-
-
Bristol: Institute of Physics) (to be published
-
Patriarche, G., Jeanne's, F., Oudar J. L., and Glas, F., 1997, Microscopy of Semiconducting Materials 1997, Inst. Phys. Conf. Ser., vol. 157 (Bristol: Institute of Physics) (to be published).
-
(1997)
Microscopy of Semiconducting Materials 1997, Inst. Phys. Conf. Ser
, pp. 157
-
-
Patriarche, G.1
Jeanne’s, F.2
Oudar, J.L.3
Glas, F.4
-
11
-
-
0029378645
-
-
Ram, R. J., Dudley, J. J., Bowers, J. E., Yang, L., Carey, K., Rosner, S. J., and Nauka, K., 1995, J. app. Phys., 78, 4227.
-
(1995)
J. App. Phys
, vol.78
, pp. 4227
-
-
Ram, R.J.1
Dudley, J.J.2
Bowers, J.E.3
Yang, L.4
Carey, K.5
Rosner, S.J.6
Nauka, K.7
-
12
-
-
85007874149
-
-
The Materials Society) (to be published
-
Sagalowicz, L., Jouneau, P. H., Rudra, A., Syrbu, V., and Kapon, E., 1997, Boundaries and Interfaces in Materials, TMS Conf. Proc. (The Materials Society) (to be published).
-
(1997)
And Kapon, E
-
-
Sagalowicz, L.1
Jouneau, P.H.2
Rudra, A.3
Syrbu, V.4
-
13
-
-
85007783908
-
-
Salomonson, F., Streubel, K., Bentell, J., Hammar, M., Keiper, D., Westphalen, R., Piprek, J.
-
-
-
Salomonson, F.1
Streubel, K.2
Bentell, J.3
Hammar, M.4
Keiper, D.5
Westphalen, R.6
Piprek, J.7
-
14
-
-
85007811824
-
-
Sagalowicz, L., Rudra, A., and Behrend, J., 1997, J. appl. Phys. (in the press).
-
(1997)
J. Appl. Phys
-
-
Sagalowicz, L.1
Rudra, A.2
Behrend, J.3
-
15
-
-
0025491857
-
-
Shieu, F. S., and Saas, L., 1990, Acta metall. mater., 9, 1653.
-
(1990)
Acta Metall. Mater
, vol.9
, pp. 1653
-
-
Shieu, F.S.1
Saas, L.2
-
16
-
-
0031559297
-
-
Syrbu, A. V., Fernandez, J., Behrend, J., Berseth, C. A., Carlin, J. F., Rudra, A., and Kapon, E., 1997, Electron. Lett., 33, 866.
-
(1997)
Electron. Lett
, vol.33
, pp. 866
-
-
Syrbu, A.V.1
Fernandez, J.2
Behrend, J.3
Berseth, C.A.4
Carlin, J.F.5
Rudra, A.6
Kapon, E.7
-
18
-
-
21544466248
-
-
Wada, H., Ogawa, Y., and Kamijoh, T., 1993, Appl. Phys. Lett., 62, 738.
-
(1993)
Appl. Phys. Lett
, vol.62
, pp. 738
-
-
Wada, H.1
Ogawa, Y.2
Kamijoh, T.3
-
19
-
-
0000654250
-
-
Zhu, J. G., and Carter, C. B., 1990, Phil. Mag. A, 62, 319.
-
(1990)
Phil. Mag. A
, vol.62
, pp. 319
-
-
Zhu, J.G.1
Carter, C.B.2
|