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Volumn 304, Issue 1, 2007, Pages 57-63

Topographic study of dislocation structure in hexagonal SiC single crystals with low dislocation density

Author keywords

A1. X ray topography; A2. Growth from vapor; B2. Semiconducting silicon compounds

Indexed keywords

BURGERS VECTOR; SEMICONDUCTING SILICON COMPOUNDS; SILICON CARBIDE; SYNCHROTRONS; TOPOGRAPHY;

EID: 34247593779     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.02.002     Document Type: Article
Times cited : (51)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.