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Volumn 304, Issue 1, 2007, Pages 57-63
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Topographic study of dislocation structure in hexagonal SiC single crystals with low dislocation density
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Author keywords
A1. X ray topography; A2. Growth from vapor; B2. Semiconducting silicon compounds
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Indexed keywords
BURGERS VECTOR;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON CARBIDE;
SYNCHROTRONS;
TOPOGRAPHY;
DISLOCATION DENSITY;
EDGE DISLOCATIONS;
ELASTIC INTERACTION;
PEIERLS ENERGY;
THREADING DISLOCATIONS;
SINGLE CRYSTALS;
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EID: 34247593779
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2007.02.002 Document Type: Article |
Times cited : (51)
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References (19)
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