XRDT study of structural defects of 6H-SiC crystals

Materials Science Forum

Volumn 483-485, Issue , 2005, Pages 311-314

  Agrosi, G ^a   Fregola, R A ^a   Monno, A ^a   Scandale, E ^a   Tempesta, G ^a  

^a UNIVERSITY OF BARI   (Italy)

Author keywords

6H SiC; Dislocations; Micro channels and crystal growth; X ray diffraction topography

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL STRUCTURE; MICROCHANNELS; OPTICAL MICROSCOPY; SYNCHROTRON RADIATION;

CONTRAST WIDTHS; SCREW DISLOCATIONS; WHITE BEAM SYNCHROTRON RADIATION SOURCE; X-RAY DIFFRACTION TOPOGRAPHY (XRDT);

SILICON CARBIDE;

EID: 34247578065     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-963-6.311     Document Type: Conference Paper

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