X-ray topography contrast of edge dislocations perpendicular to the 6H-SiC crystal surface

Technical Physics Letters

Volumn 31, Issue 6, 2005, Pages 491-493

  Okunev, A O ^a   Shul'Pina, I L ^b  

^a LOBACHEVSKY STATE UNIVERSITY OF NIZHNY NOVGOROD   (Russian Federation)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21844477832     PISSN: 10637850     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1969776     Document Type: Article

References (7)

1. L. N. Danil'chuk, Yu. A. Drozdov, A. O. Okunev, et al., Zavod. Lab. 68 (11), 24 (2002).
2. V. A. Tkal', A. O. Okunev, Yu. A. Drozdov, et al., Poverkhnost, No. 1, 32 (2004).
3. A. S. Tregubova and I. L. Shul'pina, Fiz. Tverd. Tela (Leningrad) 14, 2670 (1972)
4. [Sov. Phys. Solid State 14, 2305 (1972)].
5. E. V. Suvorov, V. I. Polovinkina, V. I. Nikitenko, et al., Phys. Status Solidi A 26, 385 (1974).
6. V. L. Indenbom and F. N. Chukhovskiǐ, Usp. Fiz. Nauk 107, 229 (1972)
7. [Sov. Phys. Usp. 15, 298 (1972)].