Properties of a submicrometer x-ray beam at the exit of a waveguide

Journal of Applied Physics

Volumn 80, Issue 9, 1996, Pages 4831-4836

  Jark, Werner ^a   Di Fonzo, Silvia ^a   Lagomarsino, Stefano ^b   Cedola, Alessia ^b   Di Fabrizio, Enzo ^b   Bram, Andreas ^c   Riekel, Christian ^c  

^a SINCROTRONE TRIESTE   (Italy)

^b Inst Elettron della Stato S   (Italy)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000916344     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363524     Document Type: Article

References (12)

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