Microcrystallography with an X-ray waveguide

Journal of Applied Crystallography

Volumn 33, Issue 5, 2000, Pages 1231-1240

  Muller M ^a   Burghammer, M ^a   Flot, D ^a   Riekel, C ^a   Morawe, C ^a   Murphy, B ^b   Cedola, A ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b DARESBURY LABORATORY   (United Kingdom)

^c Via Cineto Romano 42 00156   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTALLOGRAPHY; ELECTRIC FIELD; FIBER; POLARIMETRY; SYNCHROTRON; X RAY ANALYSIS;

EID: 0034509852     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800009249     Document Type: Article

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